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- Xiuling LiUniversity of Texas at AustinEmail verificata su utexas.edu
- Kyooho JungSamsung Electronics; University of Illinois at Urbana-ChampaignEmail verificata su samsung.com
- RR LaPierreMcMaster UniversityEmail verificata su mcmaster.ca
- Chen ZhangIBM ResearchEmail verificata su us.ibm.com
- Jae Cheol ShinProfessor at Division of Electrical and Electronics Engineering at Dongguk UniversityEmail verificata su dgu.ac.kr
- Xiang ZhaoGraduate student, Department of Electrical and Computer Engineering, University of Illinois atEmail verificata su illinois.edu
- Thomas S. WilhelmRochester Institute of TechnologyEmail verificata su rit.edu
- Aaron FinckResearch staff scientist, IBMEmail verificata su illinois.edu
- Dale Van HarlingenProfessor of Physics, University of IIlinois at Urbana-ChampaignEmail verificata su illinois.edu
- Kelson ChabakAir Force Research LaboratoryEmail verificata su us.af.mil
- Yi SongIBM ResearchEmail verificata su ibm.com
- Seung Hyun KimUniversity of Illinois at Urbana-ChampaignEmail verificata su lge.com
- Xin MiaoIBM ResearchEmail verificata su us.ibm.com
- John A. RogersSimpson/Querrey Professor, Northwestern UniversityEmail verificata su northwestern.edu
- Seth HubbardProfessor of Microsystems Engineering, Professor of Physics, Rochester Instititue of TechnologyEmail verificata su rit.edu
- Joshua D. WoodSolutions Engineering Manager, DynatraceEmail verificata su dynatrace.com
- Joseph W. LydingProfessor of Electrical and Computer Engineering, University of IllinoisEmail verificata su illinois.edu
- Ashkan BehnamDevice Engineer, MicronEmail verificata su micron.com
- Daniel WassermanProfessor of Electrical and Computer Engineering, University of Texas AustinEmail verificata su utexas.edu
- Lan YuProcess and Device integration engineer, AMATEmail verificata su amat.com
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Parsian K. Mohseni
Assistant Professor, Rochester Institute of Technology
Email verificata su rit.edu - Home page