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| Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts S Pandey, Z Liao, S Nandi, S Natarajan, A Sinha, A Singh, A Chatterjee 2021 IEEE 39th VLSI Test Symposium (VTS), 1-7, 2021 | 3 | 2021 |
| MOEMS accelerometer based on grating coupler integrated with embossed diaphragm M Balasubramanian, S Nandi, S Fathima, S Aparna, SS Vuppala, ... Conference on Lasers and Electro-Optics/Pacific Rim, s1633, 2017 | 3 | 2017 |
