Ricardo Augusto da Luz Reis
Titolo
Citata da
Citata da
Anno
Fault-tolerance techniques for SRAM-based FPGAs
FL Kastensmidt, L Carro, RA da Luz Reis
Springer, 2006
2862006
Designing fault tolerant systems into SRAM-based FPGAs
F Lima, L Carro, R Reis
Proceedings of the 40th annual Design Automation Conference, 650-655, 2003
1942003
A fault injection analysis of Virtex FPGA TMR design methodology
F Lima, C Carmichael, J Fabula, R Padovani, R Reis
RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on…, 2001
1642001
Designing fault-tolerant techniques for SRAM-based FPGAs
FG de Lima Kastensmidt, G Neuberger, RF Hentschke, L Carro, R Reis
IEEE Design & Test of Computers 21 (6), 552-562, 2004
1602004
Radiation effects on embedded systems
R Velazco, P Fouillat, R Reis
Springer Science & Business Media, 2007
1512007
Analyzing area and performance penalty of protecting different digital modules with Hamming code and triple modular redundancy
R Hentschke, F Marques, F Lima, L Carro, A Susin, R Reis
Proceedings. 15th Symposium on Integrated Circuits and Systems Design, 95-100, 2002
1432002
A multiple bit upset tolerant SRAM memory
G Neuberger, F De Lima, L Carro, R Reis
ACM Transactions on Design Automation of Electronic Systems (TODAES) 8 (4…, 2003
902003
Design of regular layouts to improve predictability
C Menezes, C Meinhardt, R Reis, R Tavares
2006 International Caribbean Conference on Devices, Circuits and Systems, 67-72, 2006
872006
An automatic technique for optimizing Reed-Solomon codes to improve fault tolerance in memories
G Neuberger, FG de Lima Kastensmidt, R Reis
IEEE design & test of computers 22 (1), 50-58, 2005
632005
Designing and testing fault-tolerant techniques for sram-based fpgas
FL Kastensmidt, G Neuberger, L Carro, R Reis
Proceedings of the 1st conference on Computing frontiers, 419-432, 2004
572004
Circuit design for reliability
R Reis, Y Cao, G Wirth
Springer New York, 2015
462015
Predictive error detection by on-line aging monitoring
JC Vazquez, V Champac, AM Ziesemer, R Reis, J Semio, IC Teixeira, ...
2010 IEEE 16th International On-Line Testing Symposium, 9-14, 2010
452010
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations
C Meinhardt, AL Zimpeck, RAL Reis
Microelectronics Reliability 54 (9-10), 2319-2324, 2014
442014
Built-in aging monitoring for safety-critical applications
JC Vazquez, V Champac, AM Ziesemer, R Reis, IC Teixeira, MB Santos, ...
2009 15th IEEE International On-Line Testing Symposium, 9-14, 2009
442009
Low-sensitivity to process variations aging sensor for automotive safety-critical applications
JC Vazquez, V Champac, AM Ziesemer, R Reis, IC Teixeira, MB Santos, ...
2010 28th VLSI Test Symposium (VTS), 238-243, 2010
432010
On the evolution of remote laboratories for prototyping digital electronic systems
LS Indrusiak, M Glesner, R Reis
IEEE Transactions on Industrial Electronics 54 (6), 3069-3077, 2007
432007
On the use of VHDL simulation and emulation to derive error rates
F Lima, S Rezgui, L Carro, R Velazco, R Reis
RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on…, 2001
402001
Effective Method for Simultaneous Gate Sizing and th Assignment Using Lagrangian Relaxation
G Flach, T Reimann, G Posser, M Johann, R Reis
IEEE transactions on computer-aided design of integrated circuits and…, 2014
392014
Designing a radiation hardened 8051-like micro-controller
FG de Lima, E Cota, L Carro, M Lubaszewski, R Reis, R Velazco, ...
Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat…, 2000
392000
Revisiting automated physical synthesis of high-performance clock networks
MR Guthaus, G Wilke, R Reis
ACM Transactions on Design Automation of Electronic Systems (TODAES) 18 (2…, 2013
382013
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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