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Brian Sierawski
Brian Sierawski
Research Associate Professor, Vanderbilt University
Verified email at vanderbilt.edu
Title
Cited by
Cited by
Year
Monte Carlo simulation of single event effects
RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ...
IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010
2792010
Impact of low-energy proton induced upsets on test methods and rate predictions
BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ...
IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009
2172009
Impact of ion energy and species on single event effects analysis
RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ...
IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007
1412007
Muon-induced single event upsets in deep-submicron technology
BD Sierawski, MH Mendenhall, RA Reed, MA Clemens, RA Weller, ...
IEEE Transactions on Nuclear Science 57 (6), 3273-3278, 2010
1402010
Multiple-bit upset in 130 nm CMOS technology
AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006
1362006
Effects of scaling on muon-induced soft errors
BD Sierawski, RA Reed, MH Mendenhall, RA Weller, RD Schrimpf, ...
2011 International Reliability Physics Symposium, 3C. 3.1-3C. 3.6, 2011
972011
Application of RADSAFE to Model the Single Event Upset Response of a 0.25 m CMOS SRAM
KM Warren, RA Weller, BD Sierawski, RA Reed, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 54 (4), 898-903, 2007
912007
Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch
KM Warren, BD Sierawski, RA Reed, RA Weller, C Carmichael, A Lesea, ...
IEEE Transactions on Nuclear Science 54 (6), 2419-2425, 2007
902007
The contribution of low-energy protons to the total on-orbit SEU rate
NA Dodds, MJ Martinez, PE Dodd, MR Shaneyfelt, FW Sexton, JD Black, ...
IEEE Transactions on Nuclear Science 62 (6), 2440-2451, 2015
822015
Ion-induced energy pulse mechanism for single-event burnout in high-voltage SiC power MOSFETs and junction barrier Schottky diodes
DR Ball, KF Galloway, RA Johnson, ML Alles, AL Sternberg, BD Sierawski, ...
IEEE Transactions on Nuclear Science 67 (1), 22-28, 2019
812019
Electron-induced single-event upsets in static random access memory
MP King, RA Reed, RA Weller, MH Mendenhall, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 60 (6), 4122-4129, 2013
782013
Physical processes and applications of the Monte Carlo radiative energy deposition (MRED) code
RA Reed, RA Weller, MH Mendenhall, DM Fleetwood, KM Warren, ...
IEEE Transactions on Nuclear Science 62 (4), 1441-1461, 2015
772015
General framework for single event effects rate prediction in microelectronics
RA Weller, RA Reed, KM Warren, MH Mendenhall, BD Sierawski, ...
IEEE Transactions on Nuclear Science 56 (6), 3098-3108, 2009
772009
CRÈME: The 2011 revision of the cosmic ray effects on micro-electronics code
JH Adams, AF Barghouty, MH Mendenhall, RA Reed, BD Sierawski, ...
IEEE Transactions on Nuclear Science 59 (6), 3141-3147, 2012
702012
Heavy-ion-induced current transients in bulk and SOI FinFETs
F El-Mamouni, EX Zhang, DR Ball, B Sierawski, MP King, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 59 (6), 2674-2681, 2012
592012
Radiation hardness of FDSOI and FinFET technologies
ML Alles, RD Schrimpf, RA Reed, LW Massengill, RA Weller, ...
IEEE 2011 International SOI Conference, 1-2, 2011
552011
Effects of multi-node charge collection in flip-flop designs at advanced technology nodes
VB Sheshadri, BL Bhuva, RA Reed, RA Weller, MH Mendenhall, ...
2010 IEEE International Reliability Physics Symposium, 1026-1030, 2010
522010
Dose Enhancement and Reduction in SiO and High- MOS Insulators
A Dasgupta, DM Fleetwood, RA Reed, RA Weller, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 57 (6), 3463-3469, 2010
452010
Dose Enhancement and Reduction in SiO and High- MOS Insulators
A Dasgupta, DM Fleetwood, RA Reed, RA Weller, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 57 (6), 3463-3469, 2010
452010
Estimating terrestrial neutron-induced SEB cross sections and FIT rates for high-voltage SiC power MOSFETs
DR Ball, BD Sierawski, KF Galloway, RA Johnson, ML Alles, AL Sternberg, ...
IEEE Transactions on Nuclear Science 66 (1), 337-343, 2018
442018
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