| Polarization relaxation induced by a depolarization field in ultrathin ferroelectric BaTiO 3 capacitors DJ Kim, JY Jo, YS Kim, YJ Chang, JS Lee, JG Yoon, TK Song, TW Noh Physical review letters 95 (23), 237602, 2005 | 416 | 2005 |
| Tunable polaronic conduction in anatase TiO2 S Moser, L Moreschini, J Jacimovic, OS Barisic, H Berger, A Magrez, ... http://prl.aps.org/abstract/PRL/v110/i19/e196403, 2013 | 303 | 2013 |
| Critical thickness of ultrathin ferroelectric BaTiO3 films YS Kim, DH Kim, JD Kim, YJ Chang, TW Noh, JH Kong, K Char, YD Park, ... Applied Physics Letters 86 (10), 102907-103100, 2005 | 287 | 2005 |
| Electronic structure of graphene on single-crystal copper substrates AL Walter, S Nie, A Bostwick, KS Kim, L Moreschini, YJ Chang, ... Physical Review B—Condensed Matter and Materials Physics 84 (19), 195443, 2011 | 274 | 2011 |
| Emergence of a Metal–Insulator Transition and High-Temperature Charge-Density Waves in VSe2 at the Monolayer Limit G Duvjir, BK Choi, I Jang, S Ulstrup, S Kang, T Thi Ly, S Kim, YH Choi, ... Nano letters 18 (9), 5432-5438, 2018 | 216 | 2018 |
| Giant Ambipolar Rashba Effect in the Semiconductor BiTeI A Crepaldi, L Moreschini, G Autès, C Tournier-Colletta, S Moser, N Virk, ... Physical Review Letters 109 (9), 096803, 2012 | 206 | 2012 |
| Fundamental thickness limit of itinerant ferromagnetic SrRuO 3 thin films YJ Chang, CH Kim, SH Phark, YS Kim, J Yu, TW Noh Physical review letters 103 (5), 057201, 2009 | 189 | 2009 |
| Highly p-doped epitaxial graphene obtained by fluorine intercalation AL Walter, KJ Jeon, A Bostwick, F Speck, M Ostler, T Seyller, L Moreschini, ... Applied Physics Letters 98 (18), 2011 | 181 | 2011 |
| Thickness-dependent structural phase transition of strained SrRuO ultrathin films: The role of octahedral tilt SH Chang, YJ Chang, SY Jang, DW Jeong, CU Jung, YJ Kim, JS Chung, ... Physical Review B—Condensed Matter and Materials Physics 84 (10), 104101, 2011 | 160 | 2011 |
| Structure and correlation effects in semiconducting YJ Chang, A Bostwick, YS Kim, K Horn, E Rotenberg Physical Review B—Condensed Matter and Materials Physics 81 (23), 235109, 2010 | 152 | 2010 |
| Localized electronic states induced by defects and possible origin of ferroelectricity in strontium titanate thin films YS Kim, J Kim, SJ Moon, WS Choi, YJ Chang, JG Yoon, J Yu, JS Chung, ... Applied Physics Letters 94 (20), 2009 | 118 | 2009 |
| Effective screening and the plasmaron bands in graphene AL Walter, A Bostwick, KJ Jeon, F Speck, M Ostler, T Seyller, L Moreschini, ... Physical Review B—Condensed Matter and Materials Physics 84 (8), 085410, 2011 | 113 | 2011 |
| Electronic Structure of the Kitaev Material α-RuCl3 Probed by Photoemission and Inverse Photoemission Spectroscopies S Sinn, CH Kim, BH Kim, KD Lee, CJ Won, JS Oh, M Han, YJ Chang, ... Scientific reports 6 (1), 39544, 2016 | 93 | 2016 |
| Ferroelectric properties of SrRuO3∕ BaTiO3∕ SrRuO3 ultrathin film capacitors free from passive layers YS Kim, JY Jo, DJ Kim, YJ Chang, JH Lee, TW Noh, TK Song, JG Yoon, ... Applied physics letters 88 (7), 2006 | 90 | 2006 |
| Long-term stability study of graphene-passivated black phosphorus under air exposure J Kim, SK Baek, KS Kim, YJ Chang, EJ Choi Current Applied Physics 16 (2), 165-169, 2016 | 85 | 2016 |
| Phase coexistence in the metal–insulator transition of a VO2 thin film YJ Chang, CH Koo, JS Yang, YS Kim, DH Kim, JS Lee, TW Noh, HT Kim, ... Thin Solid Films 486 (1-2), 46-49, 2005 | 82 | 2005 |
| Angle-resolved photoemission and quasiparticle calculation of ZnO: The need for band shift in oxide semiconductors LY Lim, S Lany, YJ Chang, E Rotenberg, A Zunger, MF Toney Physical Review B—Condensed Matter and Materials Physics 86 (23), 235113, 2012 | 78 | 2012 |
| Kinetic roughening of ion-sputtered Pd (001) surface: beyond the Kuramoto-Sivashinsky model TC Kim, CM Ghim, HJ Kim, DH Kim, DY Noh, ND Kim, JW Chung, ... Physical review letters 92 (24), 246104, 2004 | 77 | 2004 |
| Role of oxygen vacancy in HfO2/SiO2/Si (100) interfaces DY Cho, SJ Oh, YJ Chang, TW Noh, R Jung, JC Lee Applied physics letters 88 (19), 193502, 2006 | 76 | 2006 |
| Surface versus bulk characterizations of electronic inhomogeneity in a thin film YJ Chang, JS Yang, YS Kim, DH Kim, TW Noh, DW Kim, E Oh, B Kahng, ... Physical Review B—Condensed Matter and Materials Physics 76 (7), 075118, 2007 | 75 | 2007 |
Tae Won NohCenter for Correlated Electron systems, Institute for Basic Science. Department of PhysicsVerified email at cces.mygbiz.com
