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- Ratan DebnathNational Institute of Standards and Technology (NIST), Gaithersburg, USAEmail verificata su nist.gov
- Sjoerd HooglandDepartment of Electrical and Computer Engineering, University of TorontoEmail verificata su utoronto.ca
- David ZhitomirskyMITEmail verificata su mit.edu
- Andre J LabelleElectrical and Computer Engineering, University of TorontoEmail verificata su mail.utoronto.ca
- Susanna ThonJohns Hopkins University, Electrical and Computer EngineeringEmail verificata su jhu.edu
- Oleksandr VoznyyAssistant Professor at University of TorontoEmail verificata su utoronto.ca
- Alexander H. IpCERT SystemsEmail verificata su utoronto.ca
- Xihua WangAssociate Professor of Electrical and Computer Engineering, University of AlbertaEmail verificata su ualberta.ca
- Andras Pattantyus-AbrahamSTMicroelectronicsEmail verificata su st.com
- Graham H. CareyPhD student, University of TorontoEmail verificata su mail.utoronto.ca
- Ghada I KoleilatAssistant Professor, Electrical and Computer Engineering, Dalhousie UniversityEmail verificata su dal.ca
- Gerasimos KonstantatosICFOEmail verificata su icfo.es
- Pongsakorn KanjanaboosSchool of Materials Science and Innovation, Faculty of Science, Mahidol UniversityEmail verificata su mahidol.ac.th
- Xinzheng LanHuazhong University of Science and TechnologyEmail verificata su hust.edu.cn
- Amirreza KianiUniversity of TorontoEmail verificata su mail.utoronto.ca
- Mingjian YuanUniversity of TorontoEmail verificata su utoronto.ca
- Valerio AdinolfiAppleEmail verificata su apple.com
- Brandon R. SutherlandUniversity of TorontoEmail verificata su utoronto.ca
- Yuan RenUniversity of Texas at AustinEmail verificata su physics.utexas.edu
- Zheng-Hong LuUniversity of TorontoEmail verificata su utoronto.ca