| The challenge of signal integrity in deep-submicrometer CMOS technology F Caignet, S Delmas-Bendhia, E Sicard Proceedings of the IEEE 89 (4), 556-573, 2001 | 199 | 2001 |
| Multisource and battery-free energy harvesting architecture for aeronautics applications C Vankecke, L Assouère, A Wang, P Durand-Estèbe, F Caignet, ... IEEE transactions on power electronics 30 (6), 3215-3227, 2014 | 70 | 2014 |
| Performance constraints for onchip optical interconnects JH Collet, F Caignet, F Sellaye, D Litaize IEEE Journal of Selected Topics in Quantum Electronics 9 (2), 425-432, 2003 | 62 | 2003 |
| On-chip sampling in CMOS integrated circuits S Delmas-Bendhia, F Caignet, E Sicard, M Roca IEEE Transactions on Electromagnetic Compatibility 41 (4), 403-406, 1999 | 35 | 1999 |
| Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation N Monnereau, F Caignet, D Tremouilles, N Nolhier, M Bafleur Microelectronics Reliability 53 (2), 221-228, 2013 | 33 | 2013 |
| Behavioral-modeling methodology to predict Electrostatic-Discharge susceptibility failures at system level: An IBIS improvement N Monnereau, F Caignet, N Nolhier, D Trémouilles, M Bafleur 10th International Symposium on Electromagnetic Compatibility, 457-463, 2011 | 29 | 2011 |
| Investigation of modeling system ESD failure and probability using IBIS ESD models N Monnereau, F Caignet, N Nolhier, M Bafleur, D Tremouilles IEEE Transactions on Device and Materials Reliability 12 (4), 599-606, 2012 | 28 | 2012 |
| A new method for measuring signal integrity in CMOS ICs S Delmas‐Bendhia, F Caignet, E Sicard Microelectronics international 17 (1), 17-21, 2000 | 22 | 2000 |
| Investigation on ESD transient immunity of integrated circuits N Lacrampe, A Alaeldine, F Caignet, R Perdriau, M Bafleur, N Nolhier, ... 2007 IEEE International Symposium on Electromagnetic Compatibility, 1-5, 2007 | 21 | 2007 |
| Characterization of crosstalk noise in submicron CMOS integrated circuits: An experimental view JY Fourniols, M Roca, F Caignet, E Sicard IEEE transactions on electromagnetic compatibility 40 (3), 271-280, 1998 | 21 | 1998 |
| A system-level electrostatic-discharge-protection modeling methodology for time-domain analysis N Monnereau, F Caignet, D Tremouilles, N Nolhier, M Bafleur IEEE transactions on electromagnetic compatibility 55 (1), 45-57, 2012 | 20 | 2012 |
| From quasi-static to transient system level ESD simulation: Extraction of turn-on elements F Escudié, F Caignet, N Nolhier, M Bafleur 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD …, 2016 | 18 | 2016 |
| ESD system level characterization and modeling methods applied to a LIN transceiver P Besse, F Lafon, N Monnereau, F Caignet, JP Laine, A Salles, S Rigour, ... EOS/ESD Symposium Proceedings, 1-9, 2011 | 18 | 2011 |
| Characterization and modeling methodology for IC’s ESD susceptibility at system level using VF-TLP tester N Lacrampe, F Caignet, M Bafleur, N Nolhier, N Mauran 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD …, 2007 | 18 | 2007 |
| Behavioral ESD protection modeling to perform system level ESD efficient design F Caignet, N Monnereau, N Nolhier, M Bafleur 2012 Asia-Pacific Symposium on Electromagnetic Compatibility, 401-404, 2012 | 17 | 2012 |
| Impact of the power supply on the ESD system level robustness S Giraldo, C Salaméro, F Caignet Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, 1-8, 2010 | 16 | 2010 |
| Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits A Alaeldine, N Lacrampe, A Boyer, R Perdriau, F Caignet, M Ramdani, ... Microelectronics Journal 39 (12), 1728-1735, 2008 | 16 | 2008 |
| Efficiency of embedded on-chip EMI protections to continuous harmonic and fast transient pulses with respect to substrate injection A Alaeldine, N Lacrampe, JL Levant, R Perdriau, M Ramdani, F Caignet, ... 2007 IEEE International Symposium on Electromagnetic Compatibility, 1-5, 2007 | 15 | 2007 |
| On chip crosstalk characterization on deep submicron buses SD Bendhia, F Caignet, E Sicard Proceedings of the 2000 Third IEEE International Caracas Conference on …, 2000 | 14 | 2000 |
| Closed-form expressions of electric and magnetic near-fields for the calibration of near-field probes A Boyer, N Nolhier, F Caignet, SB Dhia IEEE Transactions on Instrumentation and Measurement 70, 1-15, 2021 | 13 | 2021 |
