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Khan M Farhan Shahil
Khan M Farhan Shahil
Email verificata su nxp.com
Titolo
Citata da
Citata da
Anno
Graphene–multilayer graphene nanocomposites as highly efficient thermal interface materials
KMF Shahil, AA Balandin
Nano letters 12 (2), 861-867, 2012
15612012
Thermal properties of graphene and multilayer graphene: Applications in thermal interface materials
KMF Shahil, AA Balandin
Solid state communications 152 (15), 1331-1340, 2012
9022012
Micro-Raman spectroscopy of mechanically exfoliated few-quintuple layers of Bi2Te3, Bi2Se3, and Sb2Te3 materials
KMF Shahil, MZ Hossain, V Goyal, AA Balandin
Journal of Applied Physics 111 (5), 2012
3172012
Crystal symmetry breaking in few-quintuple Bi2Te3 films: Applications in nanometrology of topological insulators
KMF Shahil, MZ Hossain, D Teweldebrhan, AA Balandin
Applied physics letters 96 (15), 2010
2222010
Low-frequency current fluctuations in “graphene-like” exfoliated thin-films of bismuth selenide topological insulators
MZ Hossain, SL Rumyantsev, KMF Shahil, D Teweldebrhan, M Shur, ...
ACS nano 5 (4), 2657-2663, 2011
872011
1/f noise in conducting channels of topological insulator materials
MZ Hossain, SL Rumyantsev, D Teweldebrhan, KMF Shahil, M Shur, ...
physica status solidi (a) 208 (1), 144-146, 2011
262011
Thermal properties of graphene: Applications in thermal interface materials
KM Shahil, V Goyal, A Balandin
ECS transactions 35 (3), 193, 2011
232011
Graphene-based nanocomposites as highly efficient thermal interface materials
KM Shahil, AA Balandin
Graphene Based Thermal Interface Materials, 1-18, 2011
112011
Graphene-based thermal interface materials
KMF Shahil, AA Balandin
2011 11th IEEE International Conference on Nanotechnology, 1193-1196, 2011
92011
Study of charge trapping/detrapping mechanism in SiO2/HfO2 stack gate dielectrics considering two-way detrapping
KMF Shahil, MN Arafat, QDM Khosru, MR Khan
2007 International Workshop on Electron Devices and Semiconductor Technology …, 2007
32007
Graphene fillers for ultra-efficient thermal interface materials
KMF Shahil, V Goyal, R Gulotty, AA Balandin
2012 IEEE Silicon Nanoelectronics Workshop (SNW), 1-2, 2012
22012
Quasi 2D Materials: Raman Nanometrology and Thermal Management Applications
KMF Shahil
University of California, Riverside, 2012
2012
Low-frequency 1/f noise in bismuth selenide Topological Insulators
MZ Hossain, KMF Shahil, D Teweldebrhan, AA Balandin, SL Rumyantsev, ...
2011 21st International Conference on Noise and Fluctuations, 480-482, 2011
2011
Low-Frequency Current Fluctuations in Graphene-like Exfoliated Thin-Films of Topological Insulators
MZ Hossain, SL Rumyantsev, KMF Shahil, D Teweldebrhan, M Shur, ...
arXiv preprint arXiv:1102.0961, 2011
2011
Graphene Reinforced Composites as Efficient Thermal Interface Materials
K Shahil, S Subrina, A Balandin
Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box …, 2011
2011
Low-Frequency Noise in “Graphene-Like” Exfoliated Thin Films of Topological Insulators
MZ Hossain, SL Rumyantsev, KMF Shahil, D Teweldebrhan, M Shur, ...
MRS Online Proceedings Library (OPL) 1344, mrss11-1344-y03-07, 2011
2011
1/f Noise in Thin Films of Topological Insulator Materials
MZ Hossain, SL Rumyantsev, D Teweldebrhan, KMF Shahil, M Shur, ...
arXiv preprint arXiv:1010.0420, 2010
2010
1/f Noise in Thin Films of Topological Insulator Materials
M Zahid Hossain, SL Rumyantsev, D Teweldebrhan, KMF Shahil, M Shur, ...
arXiv e-prints, arXiv: 1010.0420, 2010
2010
Modeling of Post Soft Breakdown Conduction through Ultrathin High-k Gate Dielectrics
KMF Shahil, MN Arafat, QDM Khosru, MR Khan
2007 IEEE Conference on Electron Devices and Solid-State Circuits, 177-180, 2007
2007
Modeling and characterization of soft breakdown phenomena in MOS devices with ultrathin high-κ gate dielectric
KMF Shahil, N Arafat, QDM Khosru, MR Khan
2007 International Semiconductor Device Research Symposium, 1-2, 2007
2007
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
Articoli 1–20