| Uncertainty evaluation for three-dimensional scanning electron microscope reconstructions based on the stereo-pair technique L Carli, G Genta, A Cantatore, G Barbato, L De Chiffre, R Levi Measurement Science and Technology 22 (3), 035103, 2011 | 45 | 2011 |
| 3D-SEM metrology for coordinate measurements at the nanometer scale L Carli DTU, Department of Mechanical Engineering, 2010 | 16 | 2010 |
| Multiple height calibration artefact for 3D microscopy L De Chiffre, L Carli, RS Eriksen CIRP annals 60 (1), 535-538, 2011 | 12 | 2011 |
| Quantifying the contribution of post-processing in computed tomography measurement uncertainty A Stolfi, MK Thompson, L Carli, L De Chiffre Procedia CIRP 43, 297-302, 2016 | 10 | 2016 |
| Integrated quality control of precision assemblies using computed tomography A Stolfi Department of Mechanical Engineering: Technical University of Denmark, 2017 | 9 | 2017 |
| Reference standards for XCT measurements of additively manufactured parts AF Obaton, CG Klingaa, C Rivet, K Mohaghegh, S Baier, JL Andreasen, ... 10th Conference on Industrial Computed Tomography, 1-10, 2020 | 7 | 2020 |
| Metrological performance of SEM 3D techniques F Marinello, S Carmignato, E Savio, P Bariani, L Carli, A Horsewell, ... 18th IMEKO TC 2 Symposium on Photonics in Measurements 2008, 2008 | 2 | 2008 |
| Accurate dimensional measurements in production environment using Dynamic Length Metrology G Dalla Costa Lyngby, Denmark: PhD thesis–Technical University of Denmark, 2017 | 1 | 2017 |
| Accuracy Enhancement of CT Measurements using Data Filtering A Stolfi, MH Kallasse, L Carli, L De Chiffre Proceedings of the 6th Conference on Industrial Computed Tomography (iCT 2016), 2016 | 1 | 2016 |
| Experimental investigation on the influence of instrument settings on pixel size and nonlinearity in SEM image formation L Carli, G Genta, A Cantatore, G Barbato, L De Chiffre, R Levi Proc. 10th EUSPEN Int. Conf, 192-5, 2010 | 1 | 2010 |
| Improvement of geometrical measurements from 3D-SEM reconstructions L Carli, L De Chiffre, A Horsewell, S Carmignato, D Santin CIRP CAT Conference 2009, 2009 | 1 | 2009 |
| Development of Focused Ion Beam technique for high speed steel 3D-SEM artefact fabrication L Carli, AN MacDonald, L De Chiffre, F Marinello, S Carmignato, ... 9th International Conference of the European Society for Precision …, 2009 | 1 | 2009 |
| Traceability of optical roughness measurements on polymers L De Chiffre, S Gasparin, L Carli, JL Andreasen 10th International Conference of the European Society for Precision …, 2008 | 1 | 2008 |
| UNCERTAINTY MODELING IN 3D SEM STEREOPHOTOGRAMMETRY L CARLI, M GALETTO, G GENTA Advanced Mathematical And Computational Tools In Metrology And Testing IX, 66-73, 2012 | | 2012 |
| I> WFUFU L Carli, MG Cox, A Crampton, M Cundeva-Blajer, AD Carri, S Demeyer, ... Advanced Mathematical and Computational Tools in Metrology and Testing IX 84 …, 2012 | | 2012 |
| Experimental investigation on 3D-SEM reconstructions of a wire gauge using stereo-pair technique L Carli, G Genta, A Cantatore, G Barbato, L De Chiffre, R Levi 11th International Conference of the European Society for Precision …, 2011 | | 2011 |
| 3D TEM nano-metrology F Marinello, A Horsewell, LC Gontard, L Carli, S Carmignato, E Savio, ... Proceedings of the Nanoscale International Seminar. Torino, 22-23 September 2008, 2008 | | 2008 |
| Wear of silicon AFM tips during the approach process L Carli, F Marinello, E Savio, L De Chiffre 10th International Conference of the European Society for Precision …, 2008 | | 2008 |
| Measurement strategies and Software for Nano-CMM: Multisensor and Multiview Experimental Measurements on Micro Components L Carli, A Voltan, G Tosello, L De Chiffre DTU Management Engineering, 2008 | | 2008 |
| Developments in nanometrology at IPL L De Chiffre, HN Hansen, P Bariani, F Marinello, A Horsewell, E Savio, ... Int. Workshop NanoMetrology, 2007 | | 2007 |
