Paolo PRINETTO
Titolo
Citata da
Citata da
Anno
Fault injection techniques and tools for embedded systems reliability evaluation
A Benso, P Prinetto
Springer Science & Business Media, 2003
2792003
GATTO: A genetic algorithm for automatic test pattern generation for large synchronous sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and…, 1996
1701996
Formal verification of hardware correctness: Introduction and survey of current research
P Camurati, P Prinetto
Computer 21 (7), 8-19, 1988
1571988
A test pattern generation methodology for low power consumption
E Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 453-457, 1998
1381998
A diagnostic test pattern generation algorithm
P Camurati, D Medina, P Prinetto, MS Reorda
Proceedings. International Test Conference 1990, 52-58, 1990
1341990
An automatic test pattern generator for large sequential circuits based on genetic algorithms
P Prinetto, M Rebaudengo, MS Reorda
Proceedings., International Test Conference, 240-249, 1994
1211994
AC/C++ source-to-source compiler for dependable applications
A Benso, S Chiusano, P Prinetto, L Tagliaferri
Proceeding International Conference on Dependable Systems and Networks. DSN…, 2000
1102000
Testability analysis and ATPG on behavioral RT-level VHDL
F Corno, P Prinetto, MS Reorda
Proceedings International Test Conference 1997, 753-759, 1997
1051997
Fast sequential circuit test generation using high-level and gate-level techniques
EM Rudnick, R Vietti, A Ellis, F Corno, P Prinetto, MS Reorda
Proceedings Design, Automation and Test in Europe, 570-576, 1998
891998
A watchdog processor to detect data and control flow errors
A Benso, S Di Carlo, G Di Natale, P Prinetto
9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 144-148, 2003
792003
New static compaction techniques of test sequences for sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings European Design and Test Conference. ED & TC 97, 37-43, 1997
731997
Diagnosis oriented test pattern generation
P Camurati, A Lioy, P Prinetto, MS Reorda
Proceedings of the European Design Automation Conference, 470,471,472,473…, 1990
711990
Advanced techniques for GA-based sequential ATPGs
F Corno, P Prinetto, M Rebaudengo, MS Reorda, R Mosca
Proceedings ED&TC European Design and Test Conference, 375-379, 1996
691996
An on-line BIST RAM architecture with self-repair capabilities
A Benso, S Chiusano, G Di Natale, P Prinetto
IEEE Transactions on Reliability 51 (1), 123-128, 2002
642002
Industrial BIST of embedded RAMs
P Camurati, P Prinetto, MS Reorda, S Barbagallo, A Burri, D Medina
IEEE Computer Architecture Letters 12 (03), 86-95, 1995
631995
Control-flow checking via regular expressions
A Benso, S Di Carlo, G Di Natale, P Prinetto, L Tagliaferri
Proceedings 10th Asian Test Symposium, 299-303, 2001
582001
GARDA: A diagnostic ATPG for large synchronous sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings the European Design and Test Conference. ED&TC 1995, 267-271, 1995
581995
HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
A Benso, S Chiusano, S Di Carlo, P Prinetto, F Ricciato, M Spadari, ...
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159…, 2000
562000
Software-based self-test of set-associative cache memories
S Di Carlo, P Prinetto, A Savino
IEEE Transactions on Computers 60 (7), 1030-1044, 2010
552010
March AB, March AB1: new March tests for unlinked dynamic memory faults
A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto
IEEE International Conference on Test, 2005., 8 pp.-841, 2005
482005
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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