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- Xingji LiHarbin Institute of TechnologyEmail verificata su hit.edu.cn
- Hsu-Sheng Tsai (蔡勖升)Harbin Institute of TechnologyEmail verificata su hit.edu.cn
- Kenneth GallowayVanderbilt UniversityEmail verificata su vanderbilt.edu
- Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Shengqiang ZhouHelmholtz-Zentrum Dresden-Rossendorf, GermanyEmail verificata su hzdr.de
- Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Mao WangHelmholtz-Zentrum Dresden-RossendorfEmail verificata su hzdr.de
- Zhenping WuBeijing University of Posts and TelecommunicationsEmail verificata su bupt.edu.cn
- Ye YuanSongshan Lake Materials LaboratoryEmail verificata su sslab.org.cn
- Yufang XieJiangsu universityEmail verificata su ujs.edu.cn
- Chi XuHelmholtz-Zentrum Dresden-RossendorfEmail verificata su hzdr.de
- xin zhouUniversity of Electronic Science and Technology of ChinaEmail verificata su uestc.edu.cn
- Lei ShuPerKing UniversityEmail verificata su hit.edu.cn
- Yonder BerencénHelmholtz-Zentrum Dresden-Rossendorf (HZDR), GermanyEmail verificata su hzdr.de