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Co-authors
- Junil ChoiTenured Associate Professor of KAIST, School of Electrical EngineeringVerified email at kaist.ac.kr
- George C. AlexandropoulosNational and Kapodistrian University of AthensVerified email at di.uoa.gr
- Hyeongtaek LeeSchool of Electrical Engineering, KAISTVerified email at kaist.ac.kr
- Hwanjin KimPurdue UniversityVerified email at purdue.edu
- Chulhee JangSamsung ElectronicsVerified email at snu.ac.kr
- A. Lee SwindlehurstProfessor of Electrical Engineering and Computer Science, University of California IrvineVerified email at uci.edu
- Ryeong Myeong KimKorea Research Institute of Standards and Science (KRISS)Verified email at kriss.re.kr
- Ki Tae NamProfessor, Department of Materials Science and Engineering, Seoul National UniversityVerified email at snu.ac.kr
- Van Ly NguyenUniversity of California IrvineVerified email at uci.edu
- Geonho HanKAISTVerified email at kaist.ac.kr