Tewfik Mohammed Souier
Tewfik Mohammed Souier
Physics department, Sultan Qaboos university
Verified email at squ.edu.om
Title
Cited by
Cited by
Year
Optical, structural and photocatalysis properties of Cu-doped TiO2 thin films
F Bensouici, M Bououdina, AA Dakhel, R Tala-Ighil, M Tounane, A Iratni, ...
Applied Surface Science 395, 110-116, 2017
1272017
Effect of the final annealing of cold rolled stainless steels sheets on the electronic properties and pit nucleation resistance of passive films
J Amri, T Souier, B Malki, B Baroux
Corrosion Science 50 (2), 431-435, 2008
1072008
A method to provide rapid in situ determination of tip radius in dynamic atomic force microscopy
S Santos, L Guang, T Souier, K Gadelrab, M Chiesa, NH Thomson
Review of Scientific Instruments 83 (4), 043707, 2012
962012
Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy
C Maragliano, S Lilliu, MS Dahlem, M Chiesa, T Souier, M Stefancich
Scientific reports 4 (1), 1-7, 2014
822014
Structure, microstructure and optical properties of Sn-doped ZnO thin films
N Chahmat, T Souier, A Mokri, M Bououdina, MS Aida, M Ghers
Journal of alloys and compounds 593, 148-153, 2014
682014
Local characterization of austenite and ferrite phases in duplex stainless steel using MFM and nanoindentation
KR Gadelrab, G Li, M Chiesa, T Souier
Journal of Materials Research 27 (12), 1573-1579, 2012
522012
Measuring the true height of water films on surfaces
S Santos, A Verdaguer, T Souier, NH Thomson, M Chiesa
Nanotechnology 22 (46), 465705, 2011
522011
Synthesis, characterization and photocatalytic behavior of Ag doped TiO2 thin film
F Bensouici, T Souier, AA Dakhel, A Iratni, R Tala-Ighil, M Bououdina
Superlattices and Microstructures 85, 255-265, 2015
452015
Local electrical characteristics of passive films formed on stainless steel surfaces by current sensing atomic force microscopy
T Souier, F Martin, C Bataillon, J Cousty
Applied surface science 256 (8), 2434-2439, 2010
432010
Mechanical properties of BixSb2− xTe3 nanostructured thermoelectric material
G Li, KR Gadelrab, T Souier, PL Potapov, G Chen, M Chiesa
Nanotechnology 23 (6), 065703, 2012
392012
Diode behavior in ultra-thin low temperature ALD grown zinc-oxide on silicon
N El-Atab, S Alqatari, FB Oruc, T Souier, M Chiesa, AK Okyay, A Nayfeh
AIP Advances 3 (10), 102119, 2013
382013
How to achieve high electrical conductivity in aligned carbon nanotube polymer composites
T Souier, C Maragliano, M Stefancich, M Chiesa
Carbon 64, 150-157, 2013
332013
Quantifying dissipative contributions in nanoscale interactions
S Santos, KR Gadelrab, T Souier, M Stefancich, M Chiesa
Nanoscale 4 (3), 792-800, 2012
302012
Enhanced electrical properties of vertically aligned carbon nanotube-epoxy nanocomposites with high packing density
T Souier, S Santos, A Al Ghaferi, M Stefancich, M Chiesa
Nanoscale research letters 7 (1), 1-8, 2012
242012
Structural, optical and photocatalytic properties of ZnO nanorods: Effect of aging time and number of layers
M Toubanea, R Tala-Ighil, F Bensouici, M Bououdina, W Cai, S Liu, ...
Ceramics International, 2016
232016
Influence of the alloying elements on pitting corrosion of stainless steels: A modeling approach
B Malki, T Souier, B Baroux
Journal of The Electrochemical Society 155 (12), C583, 2008
222008
Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution
C Maragliano, D Heskes, M Stefancich, M Chiesa, T Souier
Nanotechnology 24 (22), 225703, 2013
202013
Effect of acid nature in the starting solution on surface and photocatalytic properties of TiO2 thin films
F Bensouici, T Souier, A Iratni, AA Dakhel, R Tala-Ighil, M Bououdina
Surface and Coatings Technology 251, 170-176, 2014
182014
Structure, microstructure and determination of optical constants from transmittance data of co-doped Zn0. 90Co0. 05M0. 05O (MAl, Cu, Cd, Na) films
S Roguai, A Djelloul, C Nouveau, T Souier, AA Dakhel, M Bououdina
Journal of alloys and compounds 599, 150-158, 2014
182014
Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques
MV Diamanti, T Souier, M Stefancich, M Chiesa, MP Pedeferri
Electrochimica Acta 129, 203-210, 2014
182014
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