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- David J. LoveNick Trbovich Professor of ECE, Purdue UniversityEmail verificata su ecn.purdue.edu
- Boon Loong NgSamsung Research AmericaEmail verificata su samsung.com
- Peshal NayakEngineer, Technology StandardizationEmail verificata su samsung.com
- Gilwon LeeSamsung Research America, Plano, TXEmail verificata su samsung.com
- Jeongho JeonSamsung Research America, MV, CAEmail verificata su samsung.com
- Vishnu V RatnamStaff Research Engineer 2, Samsung Research AmericaEmail verificata su samsung.com
- James KrogmeierElectrical and Computer Engineering, Purdue UniversityEmail verificata su purdue.edu
- Hao ChenSamsung Research AmericaEmail verificata su samsung.com
- Jing GuoPurdue UniversityEmail verificata su purdue.edu
- Gary XuSamsung Research AmericaEmail verificata su samsung.com
- Joonyoung ChoSamsung Research AmericaEmail verificata su samsung.com
- Jin YuanSamsung Research America - DallasEmail verificata su samsung.com
- Younsun KimSamsungEmail verificata su samsung.com
- Taejoon KimProfessor of EECS, The University of KansasEmail verificata su ku.edu
- Young Han NamSamsungEmail verificata su samsung.com
- Junil ChoiTenured Associate Professor of KAIST, School of Electrical EngineeringEmail verificata su kaist.ac.kr
- Thomas MarzettaDistinguished Industry Professor, Department of Electrical and Computer Engineering, New YorkEmail verificata su nyu.edu
- Ameya AgaskarResearch Scientist, Amazon AlexaEmail verificata su post.harvard.edu
- Mohamed El GamalCairo University, Faculty of EngineeringEmail verificata su aucegypt.edu
- Mohamed FoudaNorthwestern UniversityEmail verificata su u.northwestern.edu