| Learning Accuracy Analysis of Memristor-based Nonlinear Computing Module on Long Short-term Memory H An, MS Al-Mamun, MK Orlowski, Y Yi Proceedings of the International Conference on Neuromorphic Systems, 5, 2018 | 6 | 2018 |
| Resistive Switching Comparison between Cu/TaOx/Ru and Cu/TaOx/Pt Memory Cells Y Fan, M Al-Mamun, B Conlon, SW King, MK Orlowski ECS Transactions 75 (32), 13, 2017 | 6 | 2017 |
| Impact of the Heat Conductivity of the Inert Electrode on ReRAM Performance and Endurance M Al-Mamun, SW King, S Meda, MK Orlowski ECS Transactions 85 (8), 207, 2018 | 4 | 2018 |
| Impact of the Heat Conductivity of the Inert Electrode on Reram Memory Cell Performance and Endurance M Al-Mamun, SW King, MK Orlowski ECS Meeting Abstracts, 1476, 2018 | 3 | 2018 |
| Robust Deep Reservoir Computing through Reliable Memristor with Improved Heat Dissipation Capability H An, MS Al-Mamun, MK Orlowski, L Liu, Y Yi IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020 | 2 | 2020 |
| Performance Degradation due to Nonlocal Heating Effects in Resistive ReRAM Memory Arrays M Al-Mamun, MK Orlowski MRS Advances, 2019 | 2 | 2019 |
| Impact of Surface Roughness of the Electrodes on the Resistive Switching in ReRam Devices M Al-Mamun, A Chakraborty, Y Li, MK Orlowski ECS Transactions 97 (1), 133, 2020 | 1 | 2020 |
| Performance Degradation of Nanofilament Switching Due to Joule Heat Dissipation MS Al-Mamun, MK Orlowski Electronics 9 (1), 127, 2020 | 1 | 2020 |
| Thermal and Chemical Integrity of Ru Electrode in Cu/TaOx/Ru ReRAM Memory Cell M Al-Mamun, SW King, M Orlowski ECS Journal of Solid State Science and Technology 8 (12), N220, 2019 | 1 | 2019 |
| Impact of Inert-electrode on the Performance and Electro-thermal Reliability of ReRAM Memory Array MS Al-Mamun Virginia Tech, 2019 | 1 | 2019 |
| (Invited) Challenges to Implement Resistive Memory Cells in the CMOS BEOL M Al-Mamun, MK Orlowski ECS Transactions 80 (6), 13-23, 2017 | 1 | 2017 |
| Impact of Embedment of Cu/TaOx/Ru on Its Device Performance M Al-Mamun, MK Orlowski Meeting abstracts, 1211, 2017 | 1 | 2017 |
| (Invited) Challenges to Implement Resistive Memory Cells in the CMOS BEOL M Al-Mamun, MK Orlowski Meeting abstracts, MA2017-02 1282, 2017 | 1* | 2017 |
| Parasitic Cell-to-Cell Heat Transfer in Reram Arrays and Thermally Induced Memory Cell Performance Degradation M Al-Mamun, M Orlowski ECS Meeting Abstracts, 1234, 2019 | | 2019 |
| Neuromorphic Semi-Organic Devices on Flexible Substrates M Al-Mamun, MK Orlowski Workshop on Innovative Nanoscale Devices and Systems, 2018 | | 2018 |
| Instability of High Resistance Conductive Filaments in RRAM Cells During the Read Operation M Al-Mamun, MK Orlowski MRS Spring meeting and exhibit, EP01.03.21, 2018 | | 2018 |
| Resistive Switching Comparison Between Cu/TaOx/Ru and Cu/TaOx/Pt Y Fan, M Al-Mamun, B Colon, MK King, Sean W, Orlowski Meeting Abstracts, 1442-1442, 2016 | | 2016 |
| Development of a Miniature, Fiber-optic Temperature Compensated Pressure Sensor M Al-Mamun Virginia Tech, 2014 | | 2014 |
| Reliability Degradation of Resistive Switching Memory Cells due to Thermal Cross-Talk MS Al-Mamun, MK Orlowski | | |
Prof. Dr. Marius OrlowskiVirginia Tech, Bradly Department of Electrical and Computer EngineeeringEmail verificata su vt.edu
