Nima Aghaee
Nima Aghaee
Email verificata su ericsson.com - Home page
TitoloCitata daAnno
An efficient temperature-gradient based burn-in technique for 3D stacked ICs
N Aghaee, Z Peng, P Eles
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014
142014
Process-variation and temperature aware SoC test scheduling technique
N Aghaee, Z Peng, P Eles
Journal of electronic testing 29 (4), 499-520, 2013
142013
Temperature-aware SoC test scheduling considering inter-chip process variation
N Aghaee, Z He, Z Peng, P Eles
2010 19th IEEE Asian Test Symposium, 395-398, 2010
142010
Adaptive temperature-aware SoC test scheduling considering process variation
N Aghaee, Z Peng, P Eles
2011 14th Euromicro Conference on Digital System Design, 197-204, 2011
122011
Process-variation and temperature aware soc test scheduling using particle swarm optimization
N Aghaee, Z Peng, P Eles
2011 IEEE 6th International Design and Test Workshop (IDT), 1-6, 2011
82011
Temperature-gradient-based burn-in and test scheduling for 3-D stacked ICs
N Aghaee, Z Peng, P Eles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (12á…, 2015
62015
Process-variation aware multi-temperature test scheduling
N Aghaee, Z Peng, P Eles
2014 27th International Conference on VLSI Design and 2014 13thá…, 2014
52014
Temperature-gradient based test scheduling for 3D stacked ICs
N Aghaee, Z Peng, P Eles
2013 IEEE 20th International Conference on Electronics, Circuits, andá…, 2013
52013
Design of a pipelined R4SDF processor
N Aghaee, M Eshghi
2009 17th European Signal Processing Conference, 963-967, 2009
52009
A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs
N Aghaee, Z Peng, P Eles
Journal of electronic testing, 2015
22015
An integrated temperature-cycling acceleration and test technique for 3D stacked ICs
N Aghaee, Z Peng, P Eles
The 20th Asia and South Pacific Design Automation Conference, 526-531, 2015
22015
Computer Aided Design of Electronics
Z Peng, P Eles, N Aghaee
22013
A Pipelined Architecture for a 20-point PFA
N Aghaee, M Eshghi
TENCON 2006-2006 IEEE Region 10 Conference, 1-4, 2006
22006
Thermal Issues in Testing of Advanced Systems on Chip
N Aghaee
http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-120798, 2015
1*2015
Efficient Test Application for Rapid Multi-Temperature Testing
N Aghaee, Z Peng, P Eles
25th Great Lakes Symposium on VLSI (GLSVLSI'15), 3-8, 2015
2015
TDTS01> Lectures
N Aghaee
Link÷ping University, 2014
2014
TDTS01> Labs
N Aghaee
Link÷ping University, 2014
2014
TDTS01> Examination
N Aghaee
Link÷ping University, 2014
2014
TDTS01> Home page
N Aghaee
Link÷ping University, 2014
2014
TDTS01> Timetable
N Aghaee
Link÷ping University, 2014
2014
Il sistema al momento non pu˛ eseguire l'operazione. Riprova pi¨ tardi.
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