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- David BishopProfessor of Electrical Engineering, Professor of Physics, Boston UniversityEmail verificata su bu.edu
- Flavio PardoNokia Bell LabsEmail verificata su nokia-bell-labs.com
- Kartik SrinivasanNational Institute of Standards and Technology and Joint Quantum Institute, NIST/UMDEmail verificata su nist.gov
- Daniel LopezProfessor of EE at Penn State University, Scientist at NIST, Director Nanofab at MRIEmail verificata su psu.edu
- Alexander YulaevIonQEmail verificata su ionq.co
- Roland RyfNokia Bell LabsEmail verificata su nokia.com
- Houxun MiaoGeneral Optics, LLCEmail verificata su geneoptics.com
- Marcelo DavancoNational Institute of Standards and TechnologyEmail verificata su nist.gov
- Herbert SheaEPFLEmail verificata su epfl.ch
- Rafael KleimanMcMaster UniversityEmail verificata su mcmaster.ca
- Andrea CentroneNational Institute of Standard and TechnologyEmail verificata su nist.gov
- Yuxiang LiuAssociate Professor of Mechanical Engineering, Worcester Polytechnic InstituteEmail verificata su wpi.edu
- Jungsang KimDuke UniversityEmail verificata su duke.edu
- Paul KolodnerEmail verificata su post.harvard.edu
- Amit AgrawalNISTEmail verificata su nist.gov
- Qing LiAssociate Professor in ECE @CMUEmail verificata su andrew.cmu.edu
- James WalkerBell Labs, Tellium, JayWalker Technical ConsultingEmail verificata su kbsolaw.com
- Sangsik KimAssociate Professor of Electrical Engineering, Korea Advanced Institute of Science and TechnologyEmail verificata su kaist.ac.kr
- Mingkang WangASML HoldingEmail verificata su asml.com
- Joseph FordUCSDEmail verificata su ucsd.edu