| Survey of test vector compression techniques NA Touba IEEE Design & test of computers 23 (4), 294-303, 2006 | 503 | 2006 |
| Static compaction techniques to control scan vector power dissipation R Sankaralingam, RR Oruganti, NA Touba Proceedings 18th IEEE VLSI Test Symposium, 35-40, 2000 | 447 | 2000 |
| Scan vector compression/decompression using statistical coding A Jas, J Ghosh-Dastidar, NA Touba Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 114-120, 1999 | 393 | 1999 |
| Test vector decompression via cyclical scan chains and its application to testing core-based designs A Jas, NA Touba Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998 | 372 | 1998 |
| Cost-effective approach for reducing soft error failure rate in logic circuits K Mohanram, NA Touba ITC 1, 893-901, 2003 | 354 | 2003 |
| An efficient test vector compression scheme using selective Huffman coding A Jas, J Ghosh-Dastidar, ME Ng, NA Touba IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2003 | 354 | 2003 |
| System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon) LT Wang, CE Stroud, NA Touba Morgan Kaufmann, 2009 | 343* | 2009 |
| Test vector encoding using partial LFSR reseeding CV Krishna, A Jas, NA Touba Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 885-893, 2001 | 291 | 2001 |
| Altering a pseudo-random bit sequence for scan-based BIST NA Touba, EJ McCluskey Proceedings International Test Conference 1996. Test and Design Validity …, 1996 | 237 | 1996 |
| Reducing test data volume using LFSR reseeding with seed compression CV Krishna, NA Touba Proceedings. International Test Conference, 321-330, 2002 | 230 | 2002 |
| Synthesis of circuits with low-cost concurrent error detection based on Bose-Lin codes D Das, NA Touba Journal of Electronic Testing 15 (1), 145-155, 1999 | 213 | 1999 |
| Logic synthesis of multilevel circuits with concurrent error detection NA Touba, EJ McCluskey IEEE transactions on computer-aided design of integrated circuits and …, 1997 | 211 | 1997 |
| Multiple bit upset tolerant memory using a selective cycle avoidance based SEC-DED-DAEC code A Dutta, NA Touba 25th IEEE VLSI Test Symposium (VTS'07), 349-354, 2007 | 200 | 2007 |
| Reducing power dissipation during test using scan chain disable R Sankaralingam, B Pouya, NA Touba Proceedings 19th IEEE VLSI Test Symposium. VTS 2001, 319-324, 2001 | 189 | 2001 |
| Reducing test data volume using external/LBIST hybrid test patterns D Das, NA Touba Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000 | 148 | 2000 |
| Test point insertion based on path tracing NA Touba, EJ McCluskey Proceedings of 14th VLSI Test Symposium, 2-8, 1996 | 143 | 1996 |
| Controlling peak power during scan testing R Sankaralingam, NA Touba Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 153-159, 2002 | 140 | 2002 |
| Weight-based codes and their application to concurrent error detection of multilevel circuits D Das, NA Touba Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 370-376, 1999 | 138 | 1999 |
| Virtual scan chains: A means for reducing scan length in cores A Jas, B Pouya, NA Touba Proceedings 18th IEEE VLSI Test Symposium, 73-78, 2000 | 131 | 2000 |
| Test data compression using dictionaries with selective entries and fixed-length indices L Li, K Chakrabarty, NA Touba ACM Transactions on Design Automation of Electronic Systems (TODAES) 8 (4 …, 2003 | 128 | 2003 |
Kartik MohanramAssociate Professor of Electrical and Computer Engineering, University of PittsburghEmail verificata su pitt.edu
