Sudhakar Reddy
Sudhakar Reddy
Department of ECE, University of Iowa
Email verificata su engineering.uiowa.edu
TitoloCitata daAnno
On delay fault testing in logic circuits
CJ Lin, SM Reddy
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 1987
6881987
Easily Testable Realizations ror Logic Functions
SM Reddy
Computers, IEEE Transactions on 100 (11), 1183-1188, 1972
4381972
COMPACTEST: A method to generate compact test sets for combinational circuits
I Pomeranz, LN Reddy, SM Reddy
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 1993
4241993
Techniques for minimizing power dissipation in scan and combinational circuits during test application
V Dabholkar, S Chakravarty, I Pomeranz, S Reddy
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 1998
3511998
Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits
S Kajihara, I Pomeranz, K Kinoshita, SM Reddy
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 1995
3021995
On Determining Scan Flip-Flops in Partial-Scan Designs.
DH Lee, SM Reddy
ICCAD, 322-325, 1990
2841990
Distributed fault-tolerance for large multiprocessor systems
JG Kuhl, SM Reddy
Proceedings of the 7th annual symposium on Computer Architecture, 23-30, 1980
2671980
A fault-tolerant communication architecture for distributed systems
DK Pradhan, SM Reddy
IEEE transactions on Computers 31 (9), 863-870, 1982
2641982
Preferred fill: A scalable method to reduce capture power for scan based designs
S Remersaro, X Lin, Z Zhang, SM Reddy, I Pomeranz, J Rajski
Test Conference, 2006. ITC'06. IEEE International, 1-10, 2006
2512006
A march test for functional faults in semiconductor random access memories
DS Suk, SM Reddy
Computers, IEEE Transactions on 100 (12), 982-985, 1981
2241981
Authors' Reply< sup> 2</sup>
DK Pradhan, SM Reddy
IEEE Transactions on Computers 24 (7), 758-759, 1975
218*1975
On path selection in combinational logic circuits
WN Li, SM Reddy, SK Sahni
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 1989
2131989
On the detection of delay faults
AK Pramanick, SM Reddy
Test Conference, 1988. Proceedings. New Frontiers in Testing, International …, 1988
2101988
A diagnosis algorithm for distributed computing systems with dynamic failure and repair
SH Hosseini, JG Kuhl, SM Reddy
Computers, IEEE Transactions on 100 (3), 223-233, 1984
1931984
An automatic test pattern generator for the detection of path delay faults
SM Reddy, CJ Lin, S Patil
proc. ICCAD 87, 284-287, 1987
1921987
Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm
Y Huang, SM Reddy, WT Cheng, P Reuter, N Mukherjee, CC Tsai, ...
Test Conference, 2002. Proceedings. International, 74-82, 2002
1862002
3-weight pseudo-random test generation based on a deterministic test set
I Pomeranz, SM Reddy
VLSI Design, 1992. Proceedings., The Fifth International Conference on, 148-153, 1992
176*1992
Robust tests for stuck-open faults in CMOS combinational logic circuits
SM Reddy, MK Reddy, VD Agrawal
Proc. Int. Symp. on Fault-Tolerant Computing, 44-49, 1984
1681984
Resource allocation and test scheduling for concurrent test of core-based SOC design
Y Huang, WT Cheng, CC Tsai, N Mukherjee, O Samman, Y Zaidan, ...
Test Symposium, 2001. Proceedings. 10th Asian, 265-270, 2001
1672001
3-weight pseudo-random test generation based on a deterministic test set for combinational and sequential circuits
I Pomeranz, SM Reddy
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 1993
1661993
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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