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- Stuart SmithProfessor of Mechanical Engineering, UNC CharlotteEmail verificata su uncc.edu
- CHABUM LEETexas A&M UniversityEmail verificata su tamu.edu
- Ericka HerazoDocente ITMEmail verificata su correo.itm.edu.co
- Joshua TarbuttonAssociate Professor of Mechanical Engineering UNCC, CPM, EPICEmail verificata su uncc.edu
- Hassan BouzahzahUniversité de LiègeEmail verificata su uqat.ca
- Bruno BussiereProfesseur, UQATEmail verificata su uqat.ca
- Mostafa BenzaazouaMohammed VI Polytechnic University - GSMIEmail verificata su um6p.ma
- Matthew AndrewCarl Zeiss MicroscopyEmail verificata su zeiss.com
- Andriy AndreyevCarl Zeiss X-Ray MicroscopyEmail verificata su zeiss.com
- Felix Hoyean KimNational Institute of Standards and TechnologyEmail verificata su nist.gov
- Shawn MoylanNational Institute of Standards and TechnologyEmail verificata su nist.gov
- Richard LeachUniversity of NottinghamEmail verificata su nottingham.ac.uk
- Abdellatif ElghaliMohammed IV Polytechnic UniversityEmail verificata su um6p.ma
- Artem AmirkhanovEmail verificata su cg.tuwien.ac.at
- Hrishikesh BaleUniversity of California, Berkeley/ Lawrence Berkeley Natl. LabEmail verificata su lbl.gov
- Dr. Martin KrenkelX-Ray System Development, Carl-Zeiss Industrielle Messtechnik GmbHEmail verificata su gwdg.de
- Ravikumar SanapalaEmail verificata su berkeley.edu
- Alaa ElwanyAssociate Professor - Texas A&M UniversityEmail verificata su tamu.edu
- Heebum ChunTexas A&M UniversityEmail verificata su tamu.edu
- Chris PeitschJohns Hopkins University Applied Physics LaboratoryEmail verificata su jhuapl.edu