Yamila M. Omar
Yamila M. Omar
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Business analytics in manufacturing: Current trends, challenges and pathway to market leadership
YM Omar, M Minoufekr, P Plapper
Operations Research Perspectives 6, 100127, 2019
A survey of information entropy metrics for complex networks
YM Omar, P Plapper
Entropy 22 (12), 1417, 2020
Lessons from social network analysis to Industry 4.0
YM Omar, M Minoufekr, P Plapper
Manufacturing Letters 15, 97-100, 2018
Multi-wall carbon nanostructured paper: characterization and potential applications definition
YM Omar, C Maragliano, CY Lai, FL Iacono, N Bologna, MV Diamanti, ...
Materials Research Express 2 (9), 095601, 2015
Detrimental Effect of Silicon Nanoparticles on P3HT: PCBM‐Based OPV Devices
M Alsari, YM Omar, MK Panda, M Chiesa, P Naumov, S Lilliu
Macromolecular Chemistry and Physics 216 (11), 1155-1160, 2015
Holistic characterization of carbon nanotube membrane for capacitive deionization electrodes application
YM Omar, C Maragliano, CY Lai, FL Iacono, N Bologna, T Shah, ...
MRS Online Proceedings Library (OPL) 1752, 125-130, 2015
Entropy of complex manufacturing networks as a metric of flexibility
YM Omar, P Plapper
Journal of Industrial Information Integration 27, 100285, 2022
Maximum flow of complex manufacturing networks
YM Omar, P Plapper
Procedia CIRP 86, 245-250, 2019
Correlation between macro-and nano-scopic measurements of carbon nanostructured paper elastic modulus
YM Omar, A Al Ghaferi, M Chiesa
Applied Physics Letters 107 (3), 031903, 2015
Reconciling macro-with nano-carrier mobility measurements in organic photovoltaic blends
YM Omar, C Maragliano, M Chiesa, A Al Ghaferi, M Stefancich
Applied Physics Letters 104 (17), 173905, 2014
Complex Networks in Manufacturing-Suitability and Interpretation
Y Omar
University of Luxembourg, Luxembourg, 2021
Operations Research Perspectives
YM Omar, M Minoufekr, P Plapper
Operations Research 6, 100127, 2019
Electrical characterization with high spatial resolution of P3HT: PCBM blends used in organic photovoltaics by means of conductive atomic force microscopy
YM Omar, M Chiesa, A Al Ghaferi
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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