Henrique Leonel Gomes

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Fabio BiscariniIstituto Italiano di Tecnologia & Professor of Chemistry, Università di Modena e Reggio EmiliaEmail verificata su iit.it
Paulo R. F. RochaAssociate Professor, Department of Life Sciences, University of CoimbraEmail verificata su uc.pt
M.C.R. Medeiros; C.R. MedeirosUniversidade de Coimbra - Instituto de TelecomunicaçõesEmail verificata su deec.uc.pt
Asal KiazadehResearcher at i3NEmail verificata su fct.unl.pt
Eloi RamonBarcelona Microelectronics Institute IMB-CNM (CSIC)Email verificata su uab.cat
Carme Martínez-Domingo, PhDInstitut de Ciència de Materials de Barcelona (ICMAB-CSIC)Email verificata su icmab.es
Reinhard R. BaumannTU ChemnitzEmail verificata su mb.tu-chemnitz.de
Ana L G MestrePhD studentEmail verificata su ualg.pt
mauro murgiaCNR-ISMNEmail verificata su cnr.it
Pedro InácioPhD Student, Instituto de Telecomunicações, Lisboa, Portugal. Universidade do Algarve, Faro, Portugal.Email verificata su ualg.pt
Edsger SmitsTNOEmail verificata su tno.nl
Elvira Fortunatoi3N/CENIMAT, Department of Materials Science, Faculty of Science and Technology, Universidade NOVAEmail verificata su fct.unl.pt
Rodrigo Ferrão Paiva MartinsFull Professor at FCT UNL, Caparica, PortugalEmail verificata su fct.unl.pt
Veit WagnerProfessor of Physics, Jacobs University Bremen, Department of Physics & Earth SciencesEmail verificata su jacobs-university.de
RH FriendUniversity of CambridgeEmail verificata su cam.ac.uk
Pedro BarquinhaAssociate Professor, FCT-NOVAEmail verificata su fct.unl.pt
Ines AraujoFaculty of Medicine and Biomedical Sciences, Algarve Biomedical Center Research Institute (ABC-RIEmail verificata su ualg.pt
Jordi CarrabinaUniversitat Autònoma de barcelonaEmail verificata su uab.cat
Sanaz AsgarifarPhD, Instituto de Telecomunicações, Lisboa, Portugal. Universidade do Algarve, Faro, PortugalEmail verificata su ualg.pt
Franco DinelliCNR - INOEmail verificata su ino.it

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Henrique Leonel Gomes

Universidade de Coimbra /Instituto de Telecomunicações

Email verificata su uc.pt - Home page

Organic Electronics Bioelectronics Device Physics Electrical Characterization Resistive Switching Memories


Titolo Ordina per citazioni Ordina per anno Ordina per titolo	Citata da Citata da	Anno
Dynamics of threshold voltage shifts in organic and amorphous silicon field‐effect transistors SGJ Mathijssen, M Cölle, H Gomes, ECP Smits, B De Boer, I McCulloch, ... Advanced Materials 19 (19), 2785-2789, 2007	265	2007
Gate-bias stress in amorphous oxide semiconductors thin-film transistors ME Lopes, HL Gomes, MCR Medeiros, P Barquinha, L Pereira, ... Applied Physics Letters 95 (6), 063502, 2009	238	2009
Bias-induced threshold voltages shifts in thin-film organic transistors HL Gomes, P Stallinga, F Dinelli, M Murgia, F Biscarini, DM De Leeuw, ... Applied Physics Letters 84 (16), 3184-3186, 2004	233	2004
Reproducible resistive switching in nonvolatile organic memories F Verbakel, SCJ Meskers, RAJ Janssen, HL Gomes, M Cölle, M Büchel, ... Applied Physics Letters 91 (19), 192103, 2007	134	2007
Effect of oxygen on the electrical characteristics of field effect transistors formed from electrochemically deposited films of poly (3-methylthiophene) DM Taylor, HL Gomes, AE Underhill, S Edge, PI Clemenson Journal of Physics D: Applied Physics 24 (11), 2032, 1991	126	1991
Electrical characterization of the rectifying contact between aluminium and electrodeposited poly (3-methylthiophene) DM Taylor, HL Gomes Journal of Physics D: Applied Physics 28 (12), 2554, 1995	110	1995
Electronic transport in field-effect transistors of sexithiophene P Stallinga, HL Gomes, F Biscarini, M Murgia, DM De Leeuw Journal of applied physics 96 (9), 5277-5283, 2004	98	2004
Electrical instabilities in organic semiconductors caused by trapped supercooled water HL Gomes, P Stallinga, M Cölle, DM De Leeuw, F Biscarini Applied Physics Letters 88 (8), 082101, 2006	96	2006
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis E Sowade, E Ramon, KY Mitra, C Martínez-Domingo, M Pedró, J Pallarès, ... Scientific reports 6 (1), 1-15, 2016	83	2016
Electrochemical noise and impedance of Au electrode/electrolyte interfaces enabling extracellular detection of glioma cell populations PRF Rocha, P Schlett, U Kintzel, V Mailänder, LKJ Vandamme, G Zeck, ... Scientific reports 6 (1), 1-10, 2016	70	2016
Up-scaling of the manufacturing of all-inkjet-printed organic thin-film transistors: Device performance and manufacturing yield of transistor arrays E Sowade, KY Mitra, E Ramon, C Martinez-Domingo, F Villani, F Loffredo, ... Organic Electronics 30, 237-246, 2016	68	2016
Electrical characterization of organic based transistors: stability issues HL Gomes, P Stallinga, F Dinelli, M Murgia, F Biscarini, DM de Leeuw, ... Polymers for Advanced technologies 16 (2‐3), 227-231, 2005	68	2005
Interface state mapping in a Schottky barrier of the organic semiconductor terrylene P Stallinga, HL Gomes, M Murgia, K Müllen organic Electronics 3 (1), 43-51, 2002	68	2002
Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methods HL Gomes, P Stallinga, H Rost, AB Holmes, MG Harrison, RH Friend Applied physics letters 74 (8), 1144-1146, 1999	55	1999
Improving positive and negative bias illumination stress stability in parylene passivated IGZO transistors A Kiazadeh, HL Gomes, P Barquinha, J Martins, A Rovisco, JV Pinto, ... Applied Physics Letters 109 (5), 051606, 2016	51	2016
Switching in polymeric resistance random-access memories (RRAMS) HL Gomes, ARV Benvenho, DM De Leeuw, M Cölle, P Stallinga, ... Organic Electronics 9 (1), 119-128, 2008	45	2008
Modeling electrical characteristics of thin-film field-effect transistors: II: effects of traps and impurities P Stallinga, HL Gomes Synthetic metals 156 (21-24), 1316-1326, 2006	40	2006
Trap states as an explanation for the Meyer–Neldel rule in semiconductors P Stallinga, HL Gomes Organic Electronics 6 (3), 137-141, 2005	40	2005
Thin-film field-effect transistors: The effects of traps on the bias and temperature dependence of field-effect mobility, including the Meyer–Neldel rule P Stallinga, HL Gomes Organic Electronics 7 (6), 592-599, 2006	39	2006
Ultralow Power Microfuses for Write‐Once Read‐Many Organic Memory Elements BC de Brito, ECP Smits, PA van Hal, TCT Geuns, B de Boer, ... Advanced materials 20 (19), 3750-3753, 2008	38	2008

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