Han Li
Titolo
Citata da
Citata da
Anno
Size effects of nanoindentation creep
H Li, AHW Ngan
Journal of materials research 19 (2), 513-522, 2004
1822004
Determining the elastic modulus and hardness of an ultra-thin film on a substrate using nanoindentation
H Li, JJ Vlassak
Journal of Materials Research 24 (3), 1114-1126, 2009
1502009
Stiffening of organosilicate glasses by organic cross-linking
H Li, JM Knaup, E Kaxiras, JJ Vlassak
Acta Materialia 59 (1), 44-52, 2011
502011
The effect of porogen loading on the stiffness and fracture energy of brittle organosilicates
H Li, Y Lin, TY Tsui, JJ Vlassak
Journal of Materials Research 24 (1), 107-116, 2009
432009
Indentation size effects on the strain rate sensitivity of nanocrystalline Ni–25at.% Al thin films
H Li, AHW Ngan
Scripta materialia 52 (9), 827-831, 2005
352005
Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium Oxide, Aluminum …
JT Gaskins, PE Hopkins, DR Merrill, SR Bauers, E Hadland, DC Johnson, ...
ECS Journal of Solid State Science and Technology 6 (10), N189-N208, 2017
332017
Continuous strain bursts in crystalline and amorphous metals during plastic deformation by nanoindentation
H Li, AHW Ngan, MG Wang
Journal of materials research 20 (11), 3072-3081, 2005
33*2005
Water diffusion and fracture behavior in nanoporous low- dielectric film stacks
H Li, TY Tsui, JJ Vlassak
Journal of Applied Physics 106 (3), 033503, 2009
312009
Water Diffusion and Fracture Behavior in Nano-Porous Low-K Dielectric Film Stacks
J Vlassak, TT Tsui, H Li
American Institute of Physics, 0
31*
The influence of hydrogen on the chemical, mechanical, optical/electronic, and electrical transport properties of amorphous hydrogenated boron carbide
BJ Nordell, S Karki, TD Nguyen, P Rulis, AN Caruso, SS Purohit, H Li, ...
Journal of Applied Physics 118 (3), 035703, 2015
302015
New methods of analyzing indentation experiments on very thin films
H Li, NX Randall, JJ Vlassak
Journal of Materials Research 25 (4), 728-734, 2010
212010
Investigation of atomic layer deposited beryllium oxide material properties for high-k dielectric applications
D Koh, JH Yum, SK Banerjee, TW Hudnall, C Bielawski, WA Lanford, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2014
202014
Atomic layer deposited lithium aluminum oxide:(In) dependency of film properties from pulsing sequence
V Miikkulainen, O Nilsen, H Li, SW King, M Laitinen, T Sajavaara, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 33 (1 …, 2015
182015
Influence of hydrogen content and network connectivity on the coefficient of thermal expansion and thermal stability for a-SiC: H thin films
SW King, L Ross, H Li, G Xu, J Bielefeld, RE Atkins, PD Henneghan, ...
Journal of Non-Crystalline Solids 389, 78-85, 2014
182014
Quantitative interfacial energy measurements of adhesion-promoted thin copper films by supercritical fluid deposition on barrier layers
CF Karanikas, H Li, JJ Vlassak, JJ Watkins
Journal of Engineering Materials and Technology 132 (2), 021014, 2010
102010
Influence of CH 2 content and network defects on the elastic properties of organosilicate glasses
JM Knaup, H Li, JJ Vlassak, E Kaxiras
Physical Review B 83 (5), 054204, 2011
92011
Method to measure the elastic modulus and hardness of thin film on substrate by nanoindentation
H Li, J Vlassak
US Patent 8,265,884, 2012
82012
Method to measure the elastic modulus and hardness of thin film on substrate by nanoindentation
H Li, J Vlassak
US Patent 8,265,884, 2012
82012
Delayed mechanical failure of the under-bump interconnects by bump shearing
H Li, TM Shaw, XH Liu, G Bonilla
Journal of Applied Physics 111 (8), 083503, 2012
72012
Fracture characterization of thin-films by dual tip indentation
M Trueba, D Gonzalez, JM Martínez-Esnaola, MT Hernandez, D Pantuso, ...
Acta Materialia 71, 44-55, 2014
52014
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