Crea il mio profilo
Accesso pubblico
Visualizza tutto21 articoli
13 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
- qian miaoThe Chinese University of Hong KongEmail verificata su cuhk.edu.hk
- Norbert KochInstitut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin and Helmholtz-Zentrum BerlinEmail verificata su physik.hu-berlin.de
- Kenjiro FukudaThin-Film Device Laboratory, RIKENEmail verificata su riken.go.jp
- Takao SomeyaProfessor, Department of Electric and Electronic Engineering, The University of TokyoEmail verificata su ee.t.u-tokyo.ac.jp
- Thorsten SchultzHelmholtz-Zentrum BerlinEmail verificata su helmholtz-berlin.de
- Jian-Bin XU (许建斌, J.B. XU)Professor of Electronic Engineering, The Chinese University of Hong KongEmail verificata su ee.cuhk.edu.hk
- Hui-Ming ChengShenyang National Laboratory for Materials Science, Institute of Metal Research, CASEmail verificata su imr.ac.cn
- Soohyung ParkKorea Institute of Science and TechnologyEmail verificata su kist.re.kr
- Wenping HuProfessor of Chemistry, Institute of Chemistry, CASEmail verificata su iccas.ac.cn
- ni zhaoThe Chinese University of Hong KongEmail verificata su ee.cuhk.edu.hk
- Guangmin ZhouTsinghua SIGSEmail verificata su alum.imr.ac.cn
Segui
Xiaomin Xu
Associate Professor, Shenzhen International Graduate School (SIGS), Tsinghua University
Email verificata su sz.tsinghua.edu.cn