Segui
Michael G. Helander
Michael G. Helander
OTI Lumionics Inc.
Email verificata su otilumionics.com - Home page
Titolo
Citata da
Citata da
Anno
Universal energy-level alignment of molecules on metal oxides
MT Greiner, MG Helander, WM Tang, ZB Wang, J Qiu, ZH Lu
Nature materials 11 (1), 76-81, 2012
10672012
Transition metal oxide work functions: the influence of cation oxidation state and oxygen vacancies
MT Greiner, L Chai, MG Helander, WM Tang, ZH Lu
Advanced Functional Materials 22 (21), 4557-4568, 2012
8572012
Chlorinated indium tin oxide electrodes with high work function for organic device compatibility
MG Helander, ZB Wang, J Qiu, MT Greiner, DP Puzzo, ZW Liu, ZH Lu
Science 332 (6032), 944-947, 2011
6682011
Unlocking the full potential of organic light-emitting diodes on flexible plastic
ZB Wang, MG Helander, J Qiu, DP Puzzo, MT Greiner, ZM Hudson, ...
Nature Photonics 5 (12), 753-757, 2011
4592011
Metal/metal‐oxide interfaces: how metal contacts affect the work function and band structure of MoO3
MT Greiner, L Chai, MG Helander, WM Tang, ZH Lu
Advanced Functional Materials 23 (2), 215-226, 2013
3992013
Highly Efficient Blue Phosphorescence from Triarylboron-Functionalized Platinum(II) Complexes of N-Heterocyclic Carbenes
ZM Hudson, C Sun, MG Helander, YL Chang, ZH Lu, S Wang
Journal of the American Chemical Society 134 (34), 13930-13933, 2012
2462012
Work function of fluorine doped tin oxide
MG Helander, MT Greiner, ZB Wang, WM Tang, ZH Lu
Journal of Vacuum Science & Technology A 29 (1), 2011
2362011
Highly efficient warm white organic light‐emitting diodes by triplet exciton conversion
YL Chang, Y Song, Z Wang, MG Helander, J Qiu, L Chai, Z Liu, ...
Advanced Functional Materials 23 (6), 705-712, 2013
2012013
Pitfalls in measuring work function using photoelectron spectroscopy
MG Helander, MT Greiner, ZB Wang, ZH Lu
Applied Surface Science 256 (8), 2602-2605, 2010
1942010
Visible colloidal nanocrystal silicon light-emitting diode
DP Puzzo, EJ Henderson, MG Helander, ZB Wang, GA Ozin, Z Lu
Nano letters 11 (4), 1585-1590, 2011
1922011
Effects of processing conditions on the work function and energy-level alignment of NiO thin films
MT Greiner, MG Helander, ZB Wang, WM Tang, ZH Lu
The Journal of Physical Chemistry C 114 (46), 19777-19781, 2010
1832010
Functionalization of a Substrate
M Helander, Z Wang, J Qiu, ZH Lu
US Patent 8,853,070, 2014
1782014
Enhancing phosphorescence and electrophosphorescence efficiency of cyclometalated Pt (II) compounds with triarylboron
ZM Hudson, C Sun, MG Helander, H Amarne, ZH Lu, S Wang
Advanced Functional Materials 20 (20), 3426-3439, 2010
1582010
Highly simplified phosphorescent organic light emitting diode with> 20% external quantum efficiency at> 10,000 cd/m2
ZB Wang, MG Helander, J Qiu, DP Puzzo, MT Greiner, ZW Liu, ZH Lu
Applied Physics Letters 98 (7), 2011
1512011
Fluorinated phenoxy boron subphthalocyanines in organic light-emitting diodes
GE Morse, MG Helander, JF Maka, ZH Lu, TP Bender
ACS Applied Materials & Interfaces 2 (7), 1934-1944, 2010
1362010
N‐Heterocyclic Carbazole‐Based Hosts for Simplified Single‐Layer Phosphorescent OLEDs with High Efficiencies
ZM Hudson, Z Wang, MG Helander, ZH Lu, S Wang
Advanced Materials 24 (21), 2922-2928, 2012
1302012
Analysis of charge-injection characteristics at electrode-organic interfaces: Case study of transition-metal oxides
ZB Wang, MG Helander, MT Greiner, J Qiu, ZH Lu
Physical Review B 80 (23), 235325, 2009
1232009
Simple and high efficiency phosphorescence organic light-emitting diodes with codeposited copper (I) emitter
Z Liu, J Qiu, F Wei, J Wang, X Liu, MG Helander, S Rodney, Z Wang, ...
Chemistry of Materials 26 (7), 2368-2373, 2014
1192014
A metallic molybdenum suboxide buffer layer for organic electronic devices
MT Greiner, MG Helander, ZB Wang, WM Tang, J Qiu, ZH Lu
Applied Physics Letters 96 (21), 2010
992010
Carrier mobility of organic semiconductors based on current-voltage characteristics
ZB Wang, MG Helander, MT Greiner, J Qiu, ZH Lu
Journal of Applied Physics 107 (3), 2010
982010
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
Articoli 1–20