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- Kyoung-sik (Jack) MoonGeorgia Institute of TechnologyEmail verificata su mse.gatech.edu
- Chia-Chi TuanIntel CorporationEmail verificata su gatech.edu
- Ziyin LinIntel CorporationEmail verificata su gatech.edu
- Chia-Yun ChenProfessor, Department of Materials Science and Engineering, National Cheng Kung UniversityEmail verificata su mail.ncku.edu.tw
- taoran lePh.D. of Electronic Engineering, Georgia Institute of TechnologyEmail verificata su ece.gatech.edu
- Manos TentzerisGeorgia TechEmail verificata su ece.gatech.edu
- Yuntong ZhuTesla, MITEmail verificata su tesla.com
- Zhiqun LinNational University of SingaporeEmail verificata su nus.edu.sg
- Bo LiKennesaw State UniversityEmail verificata su kennesaw.edu
- Ting LeiSchool of Materials Science and Engineering, Peking UniversityEmail verificata su pku.edu.cn
- Benoit HamelinDirector of Microsystems, EngeniusMicro, Atlanta, GAEmail verificata su engeniusmicro.com
- Dr. Farrokh AyaziDirector, Center for MEMS and Microsystems Technologies, Georgia Institute of TechnologyEmail verificata su gatech.edu
- Parthasarathi ChakrabortiIntel Corporation, Georgia Institute of Technology, North Carolina State UniversityEmail verificata su gatech.edu
- Pulugurtha Markondeya rajFlorida International UniversityEmail verificata su ece.gatech.edu
Segui
Liyi Li
Sr. Materials and Failure Analysis Engineer, Intel Corporation
Email verificata su gatech.edu