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- Waleed KhalilProfessor of Electrical Engineering, The Ohio State UniversityEmail verificata su osu.edu
- James WilsonUS Army Research LaboratoryEmail verificata su mail.mil
- John L. VolakisProfessor, Florida International UniversityEmail verificata su fiu.edu
- Oren EliezerSamsung SemiconductorEmail verificata su ieee.org
- Slim BoumaizaUniversity of WaterlooEmail verificata su uwaterloo.ca
- Elias A. AlwanFlorida International UniversityEmail verificata su fiu.edu
- Farooq KhanExiumEmail verificata su exium.net
- Marian VerhelstMicas - ESAT - KU Leuven, BelgiumEmail verificata su esat.kuleuven.be
- Kubilay SertelAssociate Professor, Electrical and Computer Engineering, ElectroScience Laboratory, The Ohio StateEmail verificata su ece.osu.edu
- Paolo CarboneUniversità degli Studi di Perugia - ItalyEmail verificata su unipg.it
- Robert (Bob) DanielsCTO, Cobalt Solutions, Inc.Email verificata su cobaltsolutions.net
- Mohammed IsmailProfessor and Chair, Electrical and Computer Engineering Department, Wayne State UniversityEmail verificata su wayne.edu
- Jianping GuoSun Yat-sen UniversityEmail verificata su mail.sysu.edu.cn
- Rama VenkatasubramanianCadence Design Systems, Texas Instruments, Univ of Texas at Dallas, REC Trichy (NITT)Email verificata su ieee.org
- Murtaza AliUhnder, Inc.Email verificata su ieee.org
- Dr. musrrat aliKing Faisal University, Kingdom of Saudi ArabiaEmail verificata su kfu.edu.sa
- James W. DavisProfessor of Computer Science, Ohio State UniversityEmail verificata su cse.ohio-state.edu