Joanne Zwinkels
Joanne Zwinkels
Principal Researcher, National Research Council of Canada
Email verificata su fsst.ca
Titolo
Citata da
Citata da
Anno
Photometry, radiometry and ‘the candela’: evolution in the classical and quantum world
JC Zwinkels, E Ikonen, NP Fox, G Ulm, ML Rastello
Metrologia 47 (5), R15, 2010
1032010
Spectrophotometry: Accurate measurement of optical properties of materials
TA Germer, JC Zwinkels, BK Tsai
Elsevier, 2014
422014
Instrumentation, standards, and procedures used at the National Research Council of Canada for high-accuracy fluorescence measurements
JC Zwinkels, F Gauthier
Analytica chimica acta 380 (2-3), 193-209, 1999
401999
Colour-measuring instruments and their calibration
JC Zwinkels
Displays 16 (4), 163-171, 1996
351996
Procedures and standards for accurate spectrophotometric measurements of specular reflectance
JC Zwinkels, M Nol, CX Dodd
Applied optics 33 (34), 7933-7944, 1994
331994
Disorder and the optical properties of amorphous silicon grown by molecular beam epitaxy
BJ Fogal, SK O'Leary, DJ Lockwood, JM Baribeau, M Nol, JC Zwinkels
Solid state communications 120 (11), 429-434, 2001
322001
Automated high precision variable aperture for spectrophotometer linearity testing
JC Zwinkels, DS Gignac
Applied optics 30 (13), 1678-1687, 1991
311991
State-of-the art comparability of corrected emission spectra. 1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories
U Resch-Genger, W Bremser, D Pfeifer, M Spieles, A Hoffmann, ...
Analytical chemistry 84 (9), 3889-3898, 2012
302012
Design and testing of a two-monochromator reference spectrofluorimeter for high-accuracy total radiance factor measurements
JC Zwinkels, DS Gignac, M Nevins, I Powell, A Bewsher
Applied optics 36 (4), 892-902, 1997
301997
Intrinsic wavelength standard absorption bands in holmium oxide solution for UV/visible molecular absorption spectrophotometry
JC Travis, JC Acosta, G Andor, J Bastie, P Blattner, CJ Chunnilall, ...
Journal of physical and chemical reference data 34 (1), 41-56, 2005
262005
Optical dispersion relationships in amorphous silicon grown by molecular beam epitaxy
SK O'Leary, BJ Fogal, DJ Lockwood, JM Baribeau, M Nol, JC Zwinkels
Journal of non-crystalline solids 290 (1), 57-63, 2001
262001
Design and testing of a new high-accuracy ultraviolet–visible–near-infrared spectrophotometer
JC Zwinkels, DS Gignac
Applied optics 31 (10), 1557-1567, 1992
251992
An international evaluation of holmium oxide solution reference materials for wavelength calibration in molecular absorption spectrophotometry
JC Travis, JC Zwinkels, F Mercader, A Ruz, EA Early, MV Smith, M Nol, ...
Analytical chemistry 74 (14), 3408-3415, 2002
242002
Development of optical monitor for control of thin-film deposition
I Powell, JCM Zwinkels, AR Robertson
Applied optics 25 (20), 3645-3652, 1986
221986
Optical absorption in an amorphous silicon superlattice grown by molecular beam epitaxy
DJ Lockwood, JM Baribeau, M Nol, JC Zwinkels, BJ Fogal, SK O'Leary
Solid state communications 122 (5), 271-275, 2002
202002
Straining strained molecules-I. The synthesis of the first cyclophane within a cyclophane-[2, 2] paracyclo ([2, 2] metacyclophane)
RH Mitchell, RJ Carruthers, JCM Zwinkels
Tetrahedron Letters 17 (30), 2585-2588, 1976
191976
Comparison of absolute d/O diffuse reflectance factor scales of the NRC and the PTB
JC Zwinkels, W Erb
Metrologia 34 (4), 357, 1997
181997
Influence of growth temperature on order within silicon films grown by ultrahigh-vacuum evaporation on silica
LL Tay, DJ Lockwood, JM Baribeau, M Nol, JC Zwinkels, F Orapunt, ...
Applied physics letters 88 (12), 121920, 2006
162006
Specular gloss measurement services at the National Research Council of Canada
JC Zwinkels, M Nel
Surface coatings international 78 (12), 512-516, 1995
161995
Errors in Colorimetry Caused by the Measuring Instrument.
JC Zwinkels
Textile Chemist & Colorist 21 (2), 1989
151989
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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