| Photometry, radiometry and ‘the candela’: evolution in the classical and quantum world JC Zwinkels, E Ikonen, NP Fox, G Ulm, ML Rastello Metrologia 47 (5), R15, 2010 | 103 | 2010 |
| Spectrophotometry: Accurate measurement of optical properties of materials TA Germer, JC Zwinkels, BK Tsai Elsevier, 2014 | 42 | 2014 |
| Instrumentation, standards, and procedures used at the National Research Council of Canada for high-accuracy fluorescence measurements JC Zwinkels, F Gauthier Analytica chimica acta 380 (2-3), 193-209, 1999 | 40 | 1999 |
| Colour-measuring instruments and their calibration JC Zwinkels Displays 16 (4), 163-171, 1996 | 35 | 1996 |
| Procedures and standards for accurate spectrophotometric measurements of specular reflectance JC Zwinkels, M Noël, CX Dodd Applied optics 33 (34), 7933-7944, 1994 | 33 | 1994 |
| Disorder and the optical properties of amorphous silicon grown by molecular beam epitaxy BJ Fogal, SK O'Leary, DJ Lockwood, JM Baribeau, M Noël, JC Zwinkels Solid state communications 120 (11), 429-434, 2001 | 32 | 2001 |
| Automated high precision variable aperture for spectrophotometer linearity testing JC Zwinkels, DS Gignac Applied optics 30 (13), 1678-1687, 1991 | 31 | 1991 |
| State-of-the art comparability of corrected emission spectra. 1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories U Resch-Genger, W Bremser, D Pfeifer, M Spieles, A Hoffmann, ... Analytical chemistry 84 (9), 3889-3898, 2012 | 30 | 2012 |
| Design and testing of a two-monochromator reference spectrofluorimeter for high-accuracy total radiance factor measurements JC Zwinkels, DS Gignac, M Nevins, I Powell, A Bewsher Applied optics 36 (4), 892-902, 1997 | 30 | 1997 |
| Intrinsic wavelength standard absorption bands in holmium oxide solution for UV/visible molecular absorption spectrophotometry JC Travis, JC Acosta, G Andor, J Bastie, P Blattner, CJ Chunnilall, ... Journal of physical and chemical reference data 34 (1), 41-56, 2005 | 26 | 2005 |
| Optical dispersion relationships in amorphous silicon grown by molecular beam epitaxy SK O'Leary, BJ Fogal, DJ Lockwood, JM Baribeau, M Noël, JC Zwinkels Journal of non-crystalline solids 290 (1), 57-63, 2001 | 26 | 2001 |
| Design and testing of a new high-accuracy ultraviolet–visible–near-infrared spectrophotometer JC Zwinkels, DS Gignac Applied optics 31 (10), 1557-1567, 1992 | 25 | 1992 |
| An international evaluation of holmium oxide solution reference materials for wavelength calibration in molecular absorption spectrophotometry JC Travis, JC Zwinkels, F Mercader, A Ruíz, EA Early, MV Smith, M Noël, ... Analytical chemistry 74 (14), 3408-3415, 2002 | 24 | 2002 |
| Development of optical monitor for control of thin-film deposition I Powell, JCM Zwinkels, AR Robertson Applied optics 25 (20), 3645-3652, 1986 | 22 | 1986 |
| Optical absorption in an amorphous silicon superlattice grown by molecular beam epitaxy DJ Lockwood, JM Baribeau, M Noël, JC Zwinkels, BJ Fogal, SK O'Leary Solid state communications 122 (5), 271-275, 2002 | 20 | 2002 |
| Straining strained molecules-I. The synthesis of the first cyclophane within a cyclophane-[2, 2] paracyclo ([2, 2] metacyclophane) RH Mitchell, RJ Carruthers, JCM Zwinkels Tetrahedron Letters 17 (30), 2585-2588, 1976 | 19 | 1976 |
| Comparison of absolute d/O diffuse reflectance factor scales of the NRC and the PTB JC Zwinkels, W Erb Metrologia 34 (4), 357, 1997 | 18 | 1997 |
| Influence of growth temperature on order within silicon films grown by ultrahigh-vacuum evaporation on silica LL Tay, DJ Lockwood, JM Baribeau, M Noël, JC Zwinkels, F Orapunt, ... Applied physics letters 88 (12), 121920, 2006 | 16 | 2006 |
| Specular gloss measurement services at the National Research Council of Canada JC Zwinkels, M Nöel Surface coatings international 78 (12), 512-516, 1995 | 16 | 1995 |
| Errors in Colorimetry Caused by the Measuring Instrument. JC Zwinkels Textile Chemist & Colorist 21 (2), 1989 | 15 | 1989 |
