| Temperature dependence of dark current in a CCD R Widenhorn, MM Blouke, A Weber, A Rest, E Bodegom Sensors and Camera Systems for Scientific, Industrial, and Digital …, 2002 | 197 | 2002 |
| Intraoral jaw tracking device JD Summer, E Bodegom, A Lee US Patent 5,989,023, 1999 | 148 | 1999 |
| Tensile strength of liquid He 4 JA Nissen, E Bodegom, LC Brodie, JS Semura Physical Review B 40 (10), 6617, 1989 | 96 | 1989 |
| The Meyer–Neldel rule for a property determined by two transport mechanisms R Widenhorn, A Rest, E Bodegom Journal of Applied Physics 91 (10), 6524-6528, 2002 | 70 | 2002 |
| Meyer–Neldel rule for dark current in charge-coupled devices R Widenhorn, L Mündermann, A Rest, E Bodegom Journal of Applied Physics 89 (12), 8179-8182, 2001 | 60 | 2001 |
| Exposure time dependence of dark current in CCD imagers R Widenhorn, JC Dunlap, E Bodegom IEEE Transactions on Electron Devices 57 (3), 581-587, 2010 | 39 | 2010 |
| Dark current measurements in a CMOS imager WC Porter, B Kopp, JC Dunlap, R Widenhorn, E Bodegom Sensors, Cameras, and Systems for Industrial/Scientific Applications IX 6816 …, 2008 | 39 | 2008 |
| The Meyer-Neldel rule for diodes in forward bias R Widenhorn, M Fitzgibbons, E Bodegom Journal of applied physics 96 (12), 7379-7382, 2004 | 31 | 2004 |
| New Measurements of the Tensile Strength of Liquid 4He JA Nissen, E Bodegom, LC Brodie, JS Semura Advances in Cryogenic Engineering, 999-1003, 1988 | 31 | 1988 |
| A simple model for the dynamics towards metastable states PHE Meijer, M Keskin, E Bodegom Journal of statistical physics 45, 215-232, 1986 | 28 | 1986 |
| Adapting realtime physics for distance learning with the IOLab E Bodegom, E Jensen, D Sokoloff The Physics Teacher 57 (6), 382-386, 2019 | 26 | 2019 |
| Residual images in charged-coupled device detectors A Rest, L Mündermann, R Widenhorn, E Bodegom, TC McGlinn Review of scientific instruments 73 (5), 2028-2032, 2002 | 21 | 2002 |
| Computation of dark frames in digital imagers R Widenhorn, A Rest, MM Blouke, RL Berry, E Bodegom Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII …, 2007 | 20 | 2007 |
| Diffraction of light by a focused ultrasonic wave J Huang, JA Nissen, E Bodegom Journal of applied physics 71 (1), 70-75, 1992 | 19 | 1992 |
| Homogeneous nucleation temperature of liquid He 3 D Lezak, LC Brodie, JS Semura, E Bodegom Physical Review B 37 (1), 150, 1988 | 16 | 1988 |
| Modeling nonlinear dark current behavior in CCDs JC Dunlap, MM Blouke, E Bodegom, R Widenhorn IEEE transactions on electron devices 59 (4), 1114-1122, 2012 | 12 | 2012 |
| Computational Approach to Dark Current Spectroscopy in CCDs as complex systems. I. Experimental part and choice of the uniqueness parameters R Widenhorn, E Bodegom, D Iordache, I Tunaru print at the Scientific Bull. Univ.“Politehnica” Bucharest, 2010 | 12 | 2010 |
| New Meyer-Neldel relations for the depletion and diffusion dark currents in some CCDs E Bodegom, R Widenhorn, DA Iordache 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat …, 2004 | 12 | 2004 |
| Dark current in an active pixel complementary metal-oxide-semiconductor sensor JC Dunlap, WC Porter, E Bodegom, R Widenhorn Journal of Electronic Imaging 20 (1), 013005-013005-8, 2011 | 11 | 2011 |
| Measurements of dark current in a CCD imager during light exposures R Widenhorn, I Hartwig, JC Dunlap, E Bodegom Sensors, Cameras, and Systems for Industrial/Scientific Applications IX 6816 …, 2008 | 11 | 2008 |
