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Dr. N. Manikanthababu
Dr. N. Manikanthababu
Advanced Widebandgap Materials and Devices Laboratory, Ingram School of Engineering, TSU, Texas
Email verificata su txstate.edu
Titolo
Citata da
Citata da
Anno
Temperature-dependent electrical characteristics of Ni/Au vertical Schottky barrier diodes on β-Ga2O3 epilayers
H Sheoran, BR Tak, N Manikanthababu, R Singh
ECS Journal of Solid State Science and Technology 9 (5), 055004, 2020
412020
Swift heavy ion irradiation-induced modifications in the electrical and surface properties of β-Ga2O3
N Manikanthababu, BR Tak, K Prajna, S Sarkar, K Asokan, D Kanjilal, ...
Applied Physics Letters 117 (14), 142105, 2020
312020
Electronic excitation induced defect dynamics in HfO2 based MOS devices investigated by in-situ electrical measurements
N Manikanthababu, S Vajandar, N Arun, AP Pathak, K Asokan, ...
Applied Physics Letters 112 (13), 2018
282018
SHI induced effects on the electrical and optical properties of HfO2 thin films deposited by RF sputtering
N Manikanthababu, M Dhanunjaya, SVSN Rao, AP Pathak
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2016
282016
Synthesis, characterization and radiation damage studies of high-k dielectric (HfO2) films for MOS device applications
N Manikanthababu, N Arun, M Dhanunjaya, V Saikiran, ...
Radiation Effects and Defects in Solids 170 (3), 207-217, 2015
262015
High Performance of Zero-Power-Consumption MOCVD-Grown β-Ga2O3-Based Solar-Blind Photodetectors with Ultralow Dark Current and High-Temperature …
H Sheoran, S Fang, F Liang, Z Huang, S Kaushik, N Manikanthababu, ...
ACS Applied Materials & Interfaces 14 (46), 52096-52107, 2022
222022
Gamma irradiation-induced effects on the electrical properties of HfO2-based MOS devices
N Manikanthababu, N Arun, M Dhanunjaya, SVS Nageswara Rao, ...
Radiation Effects and Defects in Solids 171 (1-2), 77-86, 2016
212016
Radiation sustenance of HfO2/β-Ga2O3 metal-oxide-semiconductor capacitors: gamma irradiation study
N Manikanthababu, BR Tak, P Kunche, R Singh, BK Panigrahi
Semiconductor Science and Technology 35, 055024, 2020
202020
Radiation tolerance, charge trapping, and defect dynamics studies of ALD-grown Al/HfO 2/Si nMOSCAPs
N Manikanthababu, T Basu, S Vajandar, SVSN Rao, BK Panigrahi, ...
Journal of Materials Science: Materials in Electronics 31 (4), 3312–3322, 2020
172020
Ion induced intermixing and consequent effects on the leakage currents in HfO2/SiO2/Si systems
N Manikanthababu, TK Chan, S Vajandar, V Saikiran, AP Pathak, ...
Applied Physics A (Materials Science & Processing) 123 (5), 303, 2017
172017
Ion beam studies of Hafnium based alternate high-k dielectric films deposited on silicon
N Manikanthababu, TK Chan, AP Pathak, G Devaraju, NS Rao, P Yang, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
172014
Review of Radiation-Induced Effects on β-Ga2O3 Materials and Devices
N Manikanthababu, H Sheoran, P Siddham, R Singh
Crystals 12 (7), 1009, 2022
122022
Effects of ion irradiation on the structural and electrical properties of HfO2/SiON/Si p-metal oxide semiconductor capacitors
N Manikanthababu, V Saikiran, T Basu, K Prajna, S Vajandar, AP Pathak, ...
Thin Solid Films 682, 156-162, 2019
102019
In Situ Electrical Characteristics and Defect Dynamics Induced by Swift Heavy Ion Irradiation in Pt/PtOx/-Ga₂O₃ Vertical Schottky Barrier Diodes
N Manikanthababu, H Sheoran, K Prajna, SA Khan, K Asokan, JV Vas, ...
IEEE Transactions on Electron Devices 69 (11), 5996-6001, 2022
82022
Effect of growth rate on crystallization of HfO2 thin films deposited by RF magnetron sputtering
M Dhanunjaya, N Manikanthababu, AP Pathak, SVS Rao
AIP Conference Proceedings 1731 (1), 2016
82016
Electronic excitation-induced tunneling and charge-trapping explored by in situ electrical characterization in Ni/HfO2/β-Ga2O3 metal–oxide–semiconductor capacitors
N Manikanthababu, BR Tak, K Prajna, S Sarkar, RC Meena, K Asokan, ...
Materials Science and Engineering: B 281, 115716, 2022
72022
Exploring current conduction mechanisms in 6 MeV ion irradiated Au/SiO2/beta-Ga2O3 metal-oxide-semiconductor devices
N Manikanthababu, BR Tak, H Sheoran, K Prajna, BK Panigrahi, R Singh
2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020
72020
Effects of growth parameters on HfO2 thin-films deposited by RF Magnetron sputtering
M Dhanunjaya, N Manikanthababu, S Ojha, S Pojprapai, AP Pathak, ...
Radiation Effects and Defects in Solids 177 (1-2), 15-26, 2022
52022
Fractional Fourier Transform Techniques for Speech Enhancement
P Kunche, N Manikanthababu
Springer International Publishing, 2020
32020
Synthesis and characterization of Ge nanocrystals embedded in high-k dielectric (HfO2) matrix
SVSNRAPP V. Saikiran, N. Manikanthababu, N. Srinivasa Rao
Advanced Materials Letters 7 (12), 957-963, 2016
32016
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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