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Mauro D'Arco
Mauro D'Arco
Università degli Studi di Napoli Federico II, Dipartimento di Ingegneria Elettrica
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Citata da
Citata da
Anno
A measurement method based on a modified version of the chirplet transform for instantaneous frequency estimation
L Angrisani, M D'Arco
IEEE Transactions on Instrumentation and Measurement 51 (4), 704-711, 2002
1022002
Modeling timing jitter effects in digital-to-analog converters
L Angrisani, M D'Arco
IEEE Transactions on Instrumentation and Measurement 58 (2), 330-336, 2008
662008
On the use of the warblet transform for instantaneous frequency estimation
L Angrisani, M D'Arco, RSL Moriello, M Vadursi
Proceedings of the 21st IEEE Instrumentation and Measurement Technology …, 2004
492004
A digital signal-processing approach for phase noise measurement
L Angrisani, M D'Apuzzo, M D'Arco
IEEE Transactions on instrumentation and measurement 50 (4), 930-935, 2001
412001
Modeling DAC output waveforms
M D'Apuzzo, M D'Arco, A Liccardo, M Vadursi
IEEE Transactions on Instrumentation and Measurement 59 (11), 2854-2862, 2010
392010
A new method for power measurements in digital wireless communication systems
L Angrisani, M D'Apuzzo, M D'Arco
IEEE Transactions on Instrumentation and Measurement 52 (4), 1097-1106, 2003
372003
An efficient pre-processing scheme to enhance resolution in band-pass signals acquisition
L Angrisani, M D'Arco, G Ianniello, M Vadursi
IEEE Transactions on Instrumentation and Measurement 61 (11), 2932-2940, 2012
352012
ANOVA-based approach for DAC diagnostics
M D'Arco, A Liccardo, N Pasquino
IEEE Transactions on Instrumentation and Measurement 61 (7), 1874-1882, 2012
352012
Clustering-based method for detecting and evaluating I/Q impairments in radio-frequency digital transmitters
L Angrisani, M D'Arco, M Vadursi
IEEE Transactions on Instrumentation and Measurement 56 (6), 2139-2146, 2007
332007
Test equipment for DAC's performance assessment: Design and characterization
A Baccigalupi, M D'Arco, A Liccardo, M Vadursi
IEEE Transactions on Instrumentation and Measurement 59 (5), 1027-1034, 2010
302010
Design and implementation of a preprocessing circuit for bandpass signals acquisition
M D'Arco, M Genovese, E Napoli, M Vadursi
IEEE Transactions on Instrumentation and Measurement 63 (2), 287-294, 2013
292013
On the suitability of compressive sampling for the measurement of electrical power quality
F Bonavolontà, M D'Arco, G Ianniello, A Liccardo, R Schiano, L Moriello, ...
2013 IEEE International Instrumentation and Measurement Technology …, 2013
262013
Error vector-based measurement method for radiofrequency digital transmitter troubleshooting
L Angrisani, M D'Arco, M Vadursi
IEEE transactions on instrumentation and measurement 54 (4), 1381-1387, 2005
262005
New digital signal-processing approach for transmitter measurements in third generation telecommunications systems
L Angrisani, M D'Apuzzo, M D'Arco
IEEE Transactions on Instrumentation and Measurement 53 (3), 622-629, 2004
262004
A time-domain approach for the analysis of nonstationary signals in power systems
M D'Apuzzo, M D'Arco
IEEE Transactions on Instrumentation and Measurement 57 (9), 1969-1977, 2008
242008
Streamline calibration modelling for a comprehensive design of ATI-based digitizers
P Monsurrò, A Trifiletti, L Angrisani, M D'Arco
Measurement 125, 386-393, 2018
222018
Sampling and time–interleaving strategies to extend high speed digitizers bandwidth
M D'Apuzzo, M D'Arco
Measurement 111, 389-396, 2017
222017
Evaluating phase noise power spectrum with variable frequency resolution
L Angrisani, A Baccigalupi, M D'Arco
IEEE Transactions on Instrumentation and Measurement 53 (3), 685-691, 2004
222004
A wide-band DSO architecture based on three time interleaved channels
M D'Apuzzo, M D'Arco
Journal of Instrumentation 11 (08), P08003, 2016
212016
Remote laboratory design and implementation as a measurement and automation experiential learning opportunity
F Bonavolontà, M D'Arco, A Liccardo, O Tamburis
IEEE Instrumentation & Measurement Magazine 22 (6), 62-67, 2019
202019
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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