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- Takao SomeyaProfessor, Department of Electric and Electronic Engineering, The University of TokyoEmail verificata su ee.t.u-tokyo.ac.jp
- Tomoyuki YokotaUniversity of TokyoEmail verificata su ntech.t.u-tokyo.ac.jp
- Mitsuru TakenakaThe University of TokyoEmail verificata su mosfet.t.u-tokyo.ac.jp
- Shinichi TakagiThe University of TokyoEmail verificata su ee.t.u-tokyo.ac.jp
- Sanghyeon Kim, S. Kim, S.-H. Kim, S....KAIST, Korea Institute of Science and Technology (KIST), imec, The University of TokyoEmail verificata su kaist.ac.kr
- Hanbit JinETRIEmail verificata su etri.re.kr
- Naoji MatsuhisaAssociate Professor, Research Center for Advanced Science and Technology, The University of TokyoEmail verificata su iis.u-tokyo.ac.jp
- Yan Wang (王 燕)Guangdong Technion, Israel Institute of Technology; The University of Tokyo; Monash University (PhD)Email verificata su technion.ac.il
- Kenjiro FukudaThin-Film Device Laboratory, RIKENEmail verificata su riken.go.jp
- Amir ReuvenyCornell TechEmail verificata su cornell.edu
- Takuya HoshiiTokyo Institute of TechnologyEmail verificata su m.titech.ac.jp
- Ryosho NakaneThe University of TokyoEmail verificata su cryst.t.u-tokyo.ac.jp
- Robert NawrockiAssistant Professor, Purdue UniversityEmail verificata su purdue.edu
- Wonryung LeeKorea Institute of Science and Technology (KIST)Email verificata su kist.re.kr
- Sungjun ParkElectrical and Computer Engineering, Ajou UniversityEmail verificata su ajou.ac.kr
- Hyunjae LeeStaff Engineer, Material Development Team, Samsung Semiconductor R&D Center