Crea il mio profilo
Accesso pubblico
Visualizza tutto11 articoli
10 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
- Alexei O. OrlovResearch Professor of Electrical Engineering, University of Notre DameEmail verificata su nd.edu
- Craig LentFreimann Professor of Engineering, Electrical Engineering, University of Notre DameEmail verificata su nd.edu
- Gary H. BernsteinDepartment of Electrical Engineering, University of Notre DameEmail verificata su nd.edu
- Debdeep JenaCornell UniversityEmail verificata su cornell.edu
- Huili Grace XingProf. of ECE & MSE, Cornell UniversityEmail verificata su cornell.edu
- Rajagopal RamasubramaniamUnilever R&D BangaloreEmail verificata su unilever.com
- Géza TóthUniversity of the Basque Country (UPV/EHU) and Ikerbasque, Bilbao, Spain. ORCID: 0000-0002-9602-751XEmail verificata su ehu.eus
- Wolfgang PorodFreimann Professor of Electrical Engineering, University of Notre DameEmail verificata su nd.edu
- Tian FangUniversity of Notre DameEmail verificata su alumni.nd.edu
- Jia GuoWolfspeed - A Cree CompanyEmail verificata su cree.com
- Yu CaoQorvoEmail verificata su qorvo.com
- Michael ShurPatricia W. and C. Sheldon Roberts Professor, Rensselaer PolytechnicEmail verificata su rpi.edu
- douglas c. hallDepartment of Electrical Engineering, University of Notre DameEmail verificata su nd.edu
- Raj Jana, Ph.D.Research Associate, University of Notre DameEmail verificata su alumni.nd.edu
- Zhaohui LiFuzhou UniversityEmail verificata su fzu.edu.cn
- Jai VermaSystem Validation Engineer, Intel CorporationEmail verificata su alumni.nd.edu
- Peter KoggeTed H. McCourtney Professor of Computer Science and Engineering, University of Notre DameEmail verificata su nd.edu
- Michael NiemierUniversity of Notre DameEmail verificata su nd.edu
- Byron J VillisArcher MaterialsEmail verificata su archerx.com.au
- Walter HuProfessor of The West China Hospital, Sichuan University, ChinaEmail verificata su wchscu.cn