Marcello Traiola
Marcello Traiola
Postdoctoral Researcher at Ecole Centrale de Lyon
Email verificata su ec-lyon.fr - Home page
Titolo
Citata da
Citata da
Anno
Test and reliability in approximate computing
L Anghel, M Benabdenbi, A Bosio, M Traiola, EI Vatajelu
Journal of Electronic Testing 34 (4), 375-387, 2018
212018
Testing approximate digital circuits: Challenges and opportunities
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018
132018
Xbargen: A memristor based boolean logic synthesis tool
M Traiola, M Barbareschi, A Mazzeo, A Bosio
2016 IFIP/IEEE International Conference on Very Large Scale Integration …, 2016
122016
Predicting the impact of functional approximation: from component-to application-level
M Traiola, A Savino, M Barbareschi, S Di Carlo, A Bosio
2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018
112018
Towards approximation during test of integrated circuits
I Wali, M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2017 IEEE 20th International Symposium on Design and Diagnostics of …, 2017
112017
A test pattern generation technique for approximate circuits based on an ILP-formulated pattern selection procedure
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
IEEE Transactions on Nanotechnology 18, 849-857, 2019
92019
On the comparison of different atpg approaches for approximate integrated circuits
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2018 IEEE 21st International Symposium on Design and Diagnostics of …, 2018
92018
Can we approximate the test of integrated circuits?
I Wali, M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
WAPCO: Workshop On Approximate Computing, 2017
82017
Investigation of mean-error metrics for testing approximate integrated circuits
M Traiola, A Virazel, P Girard, M Barbarcschi, A Bosio
2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2018
72018
Towards digital circuit approximation by exploiting fault simulation
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2017 IEEE East-West Design & Test Symposium (EWDTS), 1-7, 2017
52017
QAMR: an Approximation-Based Fully Reliable TMR Alternative for Area Overhead Reduction
B Deveautour, M Traiola, A Virazel, P Girard
2020 IEEE European Test Symposium (ETS), 1-6, 2020
42020
Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications
M Traiola, A Savino, S Di Carlo
Microelectronics Reliability 102, 113309, 2019
42019
Estimating dynamic power consumption for memristor-based CiM architecture
M Traiola, M Barbareschi, A Bosio
Microelectronics Reliability 80, 241-248, 2018
42018
Maximizing yield for approximate integrated circuits
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 810-815, 2020
32020
Memristive devices: Technology, design automation and computing frontiers
M Barbareschi, A Bosio, HA Du Nguyen, S Hamdioui, M Traiola, ...
2017 12th International Conference on Design & Technology of Integrated …, 2017
32017
A survey of testing techniques for approximate integrated circuits
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
Proceedings of the IEEE 108 (12), 2178-2194, 2020
22020
Design, verification, test and in-field implications of approximate computing systems
A Bosio, S Di Carlo, P Girard, E Sanchez, A Savino, L Sekanina, M Traiola, ...
2020 IEEE European Test Symposium (ETS), 1-10, 2020
22020
Multi-Objective Application-driven Approximate Design Method
S Barone, M Traiola, M Barbareschi, A Bosio
IEEE Access, 2021
12021
Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*
A Bosio, I O’Connor, M Traiola, J Echavarria, J Teich, MA Hanif, ...
2021 IEEE European Test Symposium (ETS), 1-10, 2021
12021
Emerging Technologies: Challenges and Opportunities for Logic Synthesis
A Bosio, M Cantan, C Marchand, I O’Connor, P Fiser, A Poittevin, ...
2021 24th International Symposium on Design and Diagnostics of Electronic …, 2021
12021
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
Articoli 1–20