Jorge Tonfat
Jorge Tonfat
Austrian Space Research Institute (IWF)
Verified email at ieee.org
Title
Cited by
Cited by
Year
FPGAs and parallel architectures for aerospace applications
F Kastensmidt, P Rech
Soft Errors and Fault-Tolerant Design, 2016
452016
Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs
J Tonfat, FL Kastensmidt, P Rech, R Reis, HM Quinn
IEEE transactions on nuclear science 62 (6), 3080-3087, 2015
372015
Analyzing the impact of radiation-induced failures in programmable SoCs
LA Tambara, P Rech, E Chielle, J Tonfat, FL Kastensmidt
IEEE Transactions on Nuclear Science 63 (4), 2217-2224, 2016
322016
Low power 3–2 and 4–2 adder compressors implemented using ASTRAN
J Tonfat, R Reis
2012 IEEE 3rd Latin American Symposium on Circuits and Systems (LASCAS), 1-4, 2012
312012
Reliability on ARM processors against soft errors through SIHFT techniques
E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ...
IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016
282016
Multiple fault injection platform for SRAM-based FPGA based on ground-level radiation experiments
J Tarrillo, J Tonfat, L Tambara, FL Kastensmidt, R Reis
2015 16th Latin-American Test Symposium (LATS), 1-6, 2015
252015
Analyzing the influence of the angles of incidence and rotation on MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA
J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ...
IEEE Transactions on Nuclear Science 64 (8), 2161-2168, 2017
212017
Method to analyze the susceptibility of HLS designs in SRAM-based FPGAs under soft errors
J Tonfat, L Tambara, A Santos, F Kastensmidt
International Symposium on Applied Reconfigurable Computing, 132-143, 2016
202016
On the reliability of linear regression and pattern recognition feedforward artificial neural networks in FPGAs
F Libano, P Rech, L Tambara, J Tonfat, F Kastensmidt
IEEE Transactions on Nuclear Science 65 (1), 288-295, 2017
192017
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs
FL Kastensmidt, J Tonfat, T Both, P Rech, G Wirth, R Reis, F Bruguier, ...
Microelectronics Reliability 54 (9-10), 2344-2348, 2014
192014
Analyzing reliability and performance trade-offs of HLS-based designs in SRAM-based FPGAs under soft errors
LA Tambara, J Tonfat, A Santos, FL Kastensmidt, NH Medina, N Added, ...
IEEE Transactions on Nuclear Science 64 (2), 874-881, 2017
182017
Energy efficient frame-level redundancy scrubbing technique for SRAM-based FPGAs
J Tonfat, F Kastensmidt, R Reis
2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 1-8, 2015
172015
Applying TMR in hardware accelerators generated by high-level synthesis design flow for mitigating multiple bit upsets in SRAM-based FPGAs
AF dos Santos, LA Tambara, F Benevenuti, J Tonfat, FL Kastensmidt
International Symposium on Applied Reconfigurable Computing, 202-213, 2017
112017
Analyzing the influence of voltage scaling for soft errors in SRAM-based FPGAs
J Tonfat, JR Azambuja, G Nazar, P Rech, C Frost, FL Kastensmidt, ...
2013 14th European Conference on Radiation and Its Effects on Components and …, 2013
102013
SET susceptibility estimation of clock tree networks from layout extraction
R Chipana, FL Kastensmidt, J Tonfat, R Reis
2012 13th Latin American Test Workshop (LATW), 1-6, 2012
92012
Leakage current analysis in static cmos logic gates for a transistor network design approach
J Tonfat, G Flach, R Reis
2016 26th International Workshop on Power and Timing Modeling, Optimization …, 2016
62016
Analyzing the influence of the angles of incidence on SEU and MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA
J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ...
2016 16th European Conference on Radiation and Its Effects on Components and …, 2016
62016
Soft error susceptibility analysis methodology of HLS designs in SRAM-based FPGAs
J Tonfat, L Tambara, A Santos, FL Kastensmidt
Microprocessors and Microsystems 51, 209-219, 2017
52017
Analysing the impact of aging and voltage scaling under neutron-induced soft error rate in SRAM-based FPGAs
FL Kastensmidt, T Jorge, T Both, P Rech, G Wirth, R da Luz Reis, ...
ESREF: European Symposium on Reliability of Electron devices, Failure …, 2014
52014
Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects
LA Tambara, JL Tonfat, R Reis, FL Kastensmidt, ECF Pereira, RG Vaz, ...
2014 15th Latin American Test Workshop-LATW, 1-6, 2014
52014
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