Crea il mio profilo
Accesso pubblico
Visualizza tutto2 articoli
0 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
- Ya-Hong XieUniversity of California Los Angeles, Materials Sciences & EngineeringEmail verificata su ucla.edu
- E A FitzgeraldCornell, ATT, MIT, Massachusetts Institute of Technology, NTUEmail verificata su mit.edu
- Muhammad Ashraful AlamJai N. Gupta Professor of Electrical Engineering, Purdue UniversityEmail verificata su purdue.edu
- Sang-Hyun OhMcKnight Professor of ECE, University of Minnesota Twin CitiesEmail verificata su umn.edu
- Gregory TimpProfessor Electrical Engineering & Biological Studies, University of Notre DameEmail verificata su nd.edu
- Martin L. GreenNISTEmail verificata su nist.gov
- Leonard FeldmanProfessor of Physics and Materials ScienceEmail verificata su rutgers.edu
- Michael HilkeMcGill UniversityEmail verificata su physics.mcgill.ca
- Andrea CalifanoColumbia Email verificata su c2b2.columbia.edu
- M. HongNatl Taiwan Univ. Bell LaboratoriesEmail verificata su phys.ntu.edu.tw
- Richard E. HowardRutgers UniversityEmail verificata su winlab.rutgers.edu
- Conor RaffertyAbcam, PLCEmail verificata su abcam.com
- A.F.J. LeviUniversity of Southern CaliforniaEmail verificata su usc.edu
- Alice E WhiteProfessor of Mechanical Engineering, Boston UniversityEmail verificata su bu.edu
- Bruce van DoverProfessor of Materials Science, Cornell UniversityEmail verificata su cornell.edu
- Randall L. HeadrickProfessor of Physics, University of VermontEmail verificata su uvm.edu
- Rafael KleimanMcMaster UniversityEmail verificata su mcmaster.ca
- George K CellerProfessor of Materials Science, Rutgers UniversityEmail verificata su rci.rutgers.edu
- Jennifer M. McKinleyUniversity of Central FloridaEmail verificata su ucf.edu
- Reginald C. FarrowNew Jersey Institute of TechnologyEmail verificata su njit.edu