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- Albert RigosiNational Institute of Standards and TechnologyEmail verificata su nist.gov
- D. B. NewellNational Institute of Standards and TechnologyEmail verificata su nist.gov
- Mattias KruskopfPhysikalisch-Technische Bundesanstalt (PTB)Email verificata su ptb.de
- Chi-Te LiangProfessor of Physics, National Taiwan UniversityEmail verificata su phys.ntu.edu.tw
- Alireza PannaNational Institutes of Standards and TechnologyEmail verificata su nist.gov
- Heather M. HillBureau of Engraving and Printing, Department of TreasuryEmail verificata su bep.gov
- Dinesh Kumar PatelPhysikalisch-Technische Bundesanstalt (PTB), Braunschweig, GermanyEmail verificata su ptb.de
- Shamith PayagalaElectrical Engineer, National Institute of Standards & TechnologyEmail verificata su nist.gov
- Angela R. Hight WalkerNational Institute of Standards and TechnologyEmail verificata su nist.gov
- Jiuning HuNational Institute of Standards and TechnologyEmail verificata su nist.gov
- Hanbyul JinProcess Development Engineer, IntelEmail verificata su intel.com
- Chiashain Chuang (莊家翔)Associate Professor of Electronic Engineering, Chung Yuan Christian UniversityEmail verificata su cycu.edu.tw
- BIYI WU台灣大學博士班Email verificata su ntu.edu.tw
- Martina MarzanoResearcher, Istituto Nazionale di Ricerca Metrologica (INRiM), Torino, ItalyEmail verificata su inrim.it
- Mariano A. RealDepartment of Quantum Metrology, Instituto Nacional de Tecnología Industrial (INTI), ArgentinaEmail verificata su inti.gob.ar
- David Goldhaber-GordonProfessor of Physics, Stanford UniversityEmail verificata su stanford.edu
- Kang L. WangElectrical Engineering DepartmentEmail verificata su ee.ucla.edu
- Chieh-Wen LiuCleveland ClinicEmail verificata su ccf.org
- Tian ShenAppleEmail verificata su apple.com
- Nobu-Hisa KanekoPrime Senior Researcher, NMIJ/AISTEmail verificata su aist.go.jp