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- Alexander B. YakovlevProfessor of Electrical Engineering, University of MississippiEmail verificata su olemiss.edu
- Chandra S. R. KaipaQualcomm Technologies Inc.Email verificata su olemiss.edu
- George HansonProfessor of Electrical Engineering, University of Wisconsin-MilwaukeeEmail verificata su uwm.edu
- Francisco MedinaUniversidad de Sevilla, Dept. Electronica y Electromagnetismo, Seville, SpainEmail verificata su us.es
- Francisco MesaUniversidad de SevillaEmail verificata su us.es
- Andrea AluCUNY Advanced Science Research CenterEmail verificata su gc.cuny.edu
- Pai-Yen ChenAssociate Professor, Electrical and Computer Engineering, University of Illinois ChicagoEmail verificata su uic.edu
- Hossein Mehrpour BernetyPostdoctoral Scholar at Stanford UniversityEmail verificata su stanford.edu
- Salman KarbasiUniversity of California, San Diego (past), UWM (past)Email verificata su ucsd.edu
- Arash MafiUniversity of KansasEmail verificata su ku.edu
- Stanislav I. MaslovskiPrincipal Researcher, Department of Electronics, Telecommunications, and Informatics, Aveiro Univ.Email verificata su co.it.pt
- Mário SilveirinhaProfessor of Electrical Engineering, University of Lisbon, PortugalEmail verificata su tecnico.ulisboa.pt
- Simovski ConstantinAalto UniversityEmail verificata su aalto.fi
- Sergei TretyakovDepartment of Electronics and Nanoengineering, Aalto UniversityEmail verificata su aalto.fi
- Pavel BelovITMO UniversityEmail verificata su metalab.ifmo.ru
- Igor nefedovAalto University, Dept. of Electronics and NanoengineeringEmail verificata su aalto.fi
- Kai Fong LeeDean Emeritus, School of Engineering, University of MississippiEmail verificata su olemiss.edu
- Atef Z. ElsherbeniProfessor, EE Department, Colorado School of MinesEmail verificata su mines.edu