| Modeling and compensation of IR drop in crosspoint accelerators of neural networks N Lepri, M Baldo, P Mannocci, A Glukhov, V Milo, D Ielmini IEEE Transactions on Electron Devices 69 (3), 1575-1581, 2022 | 19 | 2022 |
| Modeling of virgin state and forming operation in embedded phase change memory (PCM) M Baldo, O Melnic, M Scuderi, G Nicotra, M Borghi, E Petroni, A Motta, ... 2020 IEEE International Electron Devices Meeting (IEDM), 13.3. 1-13.3. 4, 2020 | 10 | 2020 |
| Modeling of oxide-based ECRAM programming by drift-diffusion ion transport M Baldo, D Ielmini 2021 IEEE International Memory Workshop (IMW), 1-4, 2021 | 8* | 2021 |
| Improving Ge-rich GST ePCM reliability through BEOL engineering A Redaelli, A Gandolfo, G Samanni, E Gomiero, E Petroni, L Scotti, ... ESSDERC 2021-IEEE 51st European Solid-State Device Research Conference …, 2021 | 6 | 2021 |
| BEOL process effects on ePCM reliability A Redaelli, A Gandolfo, G Samanni, E Gomiero, E Petroni, L Scotti, ... IEEE Journal of the Electron Devices Society 10, 563-568, 2022 | 4 | 2022 |
| Advanced Metrics for Quantification of By‐Process Segregation beyond Ternary Systems E Petroni, M Patelmo, A Serafini, D Codegoni, L Laurin, M Baldo, ... physica status solidi (RRL)–Rapid Research Letters 17 (8), 2200458, 2023 | 3 | 2023 |
| Modeling environment for Ge-rich GST phase change memory cells M Baldo, L Laurin, E Petroni, G Samanni, M Allegra, E Gomiero, D Ielmini, ... 2022 IEEE International Memory Workshop (IMW), 1-4, 2022 | 2 | 2022 |
| Modeling and Analysis of Virgin Ge-Rich GST Embedded Phase Change Memories M Baldo, O Melnic, M Scudieri, G Nicotra, M Borghi, E Petroni, A Motta, ... IEEE Transactions on Electron Devices 70 (3), 1055-1060, 2023 | 1 | 2023 |
| Interaction between forming pulse and integration process flow in ePCM M Baldo, E Petroni, L Laurin, G Samanni, O Melinc, D Ielmini, A Redaelli 2022 17th Conference on Ph. D Research in Microelectronics and Electronics …, 2022 | 1 | 2022 |
| Study of Ge-Rich Ge-Sb-Te Device-Dependent Segregation for Industrial Grade Embedded Phase-Change Memory E Petroni, M Allegra, M Baldo, L Laurin, A Serafini, L Favennec, ... PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2024 | | 2024 |
| TCAD Modeling of Germanium Behavior During Forming Operation in Ge-Rich ePCM M Baldo, L Laurin, E Petroni, C Pavesi, A Motta, D Ielmini, R Annunziata, ... 2023 International Conference on Simulation of Semiconductor Processes and …, 2023 | | 2023 |
| Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology L Laurin, M Baldo, E Petroni, G Samanni, L Turconi, A Motta, M Borghi, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2023 | | 2023 |
| Enhancing reliability of a strong physical unclonable function (PUF) solution based on virgin-state phase change memory (PCM) L Cattaneo, M Baldo, N Lepri, F Sancandi, M Borghi, E Petroni, A Serafini, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | | 2023 |
| Characterization of reset state through energy activation study in Ge-GST based ePCM M Baldo, L Turconi, A Motta, E Petroni, L Laurin, D Ielmini, A Redaelli ESSDERC 2022-IEEE 52nd European Solid-State Device Research Conference …, 2022 | | 2022 |
| Study of Ge‐Rich Ge–Sb–Te Device‐Dependent Segregation for Industrial Grade Embedded Phase‐Change Memory E Petroni, M Allegra, M Baldo, L Laurin, A Serafini, L Favennec, ... physica status solidi (RRL)–Rapid Research Letters, 2300449, 0 | | |
| RECENT PROGRESSES OF IN-MEMORY COMPUTING: MATERIALS, DEVICES AND ARCHITECTURES D Ielmini, F Sancandi, M Farronato, S Hashemkhani, S Ricci, M Baldo, ... BOOK OF ABSTRACTS, 23, 0 | | |
Daniele IelminiProfessor of ElectronicsEmail verificata su elet.polimi.it
