Silvia Chiusano
TitoloCitata daAnno
A lazy approach to associative classification
E Baralis, S Chiusano, P Garza
IEEE Transactions on Knowledge and Data Engineering 20 (2), 156-171, 2007
1042007
AC/C++ source-to-source compiler for dependable applications
A Benso, S Chiusano, P Prinetto, L Tagliaferri
Proceeding International Conference on Dependable Systems and Networks. DSN …, 2000
972000
On support thresholds in associative classification
E Baralis, S Chiusano, P Garza
Proceedings of the 2004 ACM symposium on Applied computing, 553-558, 2004
712004
An on-line BIST RAM architecture with self-repair capabilities
A Benso, S Chiusano, G Di Natale, P Prinetto
IEEE Transactions on Reliability 51 (1), 123-128, 2002
632002
Essential classification rule sets
E Baralis, S Chiusano
ACM Transactions on Database Systems (TODS) 29 (4), 635-674, 2004
522004
HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
A Benso, S Chiusano, S Di Carlo, P Prinetto, F Ricciato, M Spadari, ...
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
492000
Analysis of diabetic patients through their examination history
D Antonelli, E Baralis, G Bruno, T Cerquitelli, S Chiusano, N Mahoto
Expert Systems with Applications 40 (11), 4672-4678, 2013
392013
An effective distributed BIST architecture for RAMs
ML Bodoni, A Benso, S Chiusano, S Di Carlo, G Di Natale, P Prinetto
Proceedings IEEE European Test Workshop, 119-124, 2000
372000
Non-intrusive BIST for systems-on-a-chip
S Chiusano, P Prijetto, HJ Wunderlich
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
342000
IMine: Index support for item set mining
E Baralis, T Cerquitelli, S Chiusano
IEEE Transactions on Knowledge and data engineering 21 (4), 493-506, 2008
322008
A family of self-repair SRAM cores
A Benso, S Chiusano, G Di Natale, P Prinetto, ML Bodoni
Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No …, 2000
302000
Cellular automata for deterministic sequential test pattern generation
S Chiusano, F Corno, P Prinetto, MS Reorda
Proceedings. 15th IEEE VLSI Test Symposium (Cat. No. 97TB100125), 60-65, 1997
291997
Optimal hardware pattern generation for functional BIST
S Cataldo, S Chiusano, P Prinetto, HJ Wunderlich
Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2000
262000
Energy signature analysis: Knowledge at your fingertips
A Acquaviva, D Apiletti, A Attanasio, E Baralis, L Bottaccioli, ...
2015 IEEE International Congress on Big Data, 543-550, 2015
252015
Analysis of twitter data using a multiple-level clustering strategy
E Baralis, T Cerquitelli, S Chiusano, L Grimaudo, X Xiao
International Conference on Model and Data Engineering, 13-24, 2013
252013
Searum: A cloud-based service for association rule mining
D Apiletti, E Baralis, T Cerquitelli, S Chiusano, L Grimaudo
2013 12th IEEE International Conference on Trust, Security and Privacy in …, 2013
252013
Index support for frequent itemset mining in a relational DBMS
E Baralis, T Cerquitelli, S Chiusano
21st International Conference on Data Engineering (ICDE'05), 754-765, 2005
242005
On applying the set covering model to reseeding
S Chiusano, S Di Carlo, P Prinetto, HJ Wunderlich
Proceedings Design, Automation and Test in Europe. Conference and Exhibition …, 2001
242001
" BOND": An interposition agents based fault injector for Windows NT
A Baldini, A Benso, S Chiusano, P Prinetto
Proceedings IEEE International Symposium on Defect and Fault Tolerance in …, 2000
232000
HD-BIST: a hierarchical framework for BIST scheduling and diagnosis in SOCs
A Benso, S Cataldo, S Chiusano, P Prinetto, Y Zorian
International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999
231999
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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