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- Cheol Seong HwangProfessor, Department of Materials Science and Engineering, Seoul National UniversityEmail verificata su snu.ac.kr
- Woongkyu LeeSoongsil UniversityEmail verificata su ssu.ac.kr
- Youngjin KimKyonggi UniversityEmail verificata su kyonggi.ac.kr
- Seong Keun KimKorea Institute of Science and TechnologyEmail verificata su kist.re.kr
- Taehwan MoonDepartment of Intelligence Semiconductor Engineering, Ajou UniversityEmail verificata su ajou.ac.kr
- Jeong Hwan HanSeoul National University of Science and Technology (SEOULTECH)Email verificata su seoultech.ac.kr
- Min Hyuk ParkSeoul National UniversityEmail verificata su snu.ac.kr
- Kyung Jean YoonIntel Santa ClaraEmail verificata su intel.com
- Jung Ho YoonAssistant Professor at Sungkyunkwan UniversityEmail verificata su skku.edu
- Gun Hwan KimAssociate Professor, Yonsei UniversityEmail verificata su yonsei.ac.kr
- Dong Hee HanDept. of Advanced Materials Engineering for Information & Electronics, Kyung Hee UniversityEmail verificata su khu.ac.kr
- Yeonchoo ChoSamsung Advanced Institute of TechnologyEmail verificata su samsung.com
- Dae Seon KwonimecEmail verificata su imec.be
- Sang-Soo LeeKorea Institute of Science and TechnologyEmail verificata su kist.re.kr
- Ji-Hoon AhnHanyang UniversityEmail verificata su hanyang.ac.kr
- Heesuk KimKorea Institute of Science and TechnologyEmail verificata su kist.re.kr
- Patrice GONONLTM / Université Grenoble Alpes (UGA)Email verificata su cea.fr
- Christophe ValleeProfesseur CNSE Albany / Professeur UGAEmail verificata su albany.edu
- Taeyong EomCenter for Thin Film Materials, Korea Research Institute of Chemical TechnologyEmail verificata su krict.re.kr
- Hoisung ChungPrincipal Engineer in Samsung ElectronicsEmail verificata su samsung.com