| FlexGripPlus: An improved GPGPU model to support reliability analysis JER Condia, B Du, MS Reorda, L Sterpone Microelectronics Reliability 109, 113660, 2020 | 68 | 2020 |
| Ultrahigh energy heavy ion test beam on Xilinx Kintex-7 SRAM-based FPGA B Du, L Sterpone, S Azimi, DM Codinachs, V Ferlet-Cavrois, CB Polo, ... IEEE Transactions on Nuclear Science 66 (7), 1813-1819, 2019 | 45 | 2019 |
| On the reliability of convolutional neural network implementation on SRAM-based FPGA B Du, S Azimi, C De Sio, L Bozzoli, L Sterpone 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019 | 42 | 2019 |
| Online test of control flow errors: A new debug interface-based approach B Du, MS Reorda, L Sterpone, L Parra, M Portela-García, A Lindoso, ... IEEE Transactions on Computers 65 (6), 1846-1855, 2015 | 31 | 2015 |
| About the functional test of the GPGPU scheduler B Du, JER Condia, MS Reorda, L Sterpone 2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018 | 23 | 2018 |
| Analyzing radiation-induced transient errors on SRAM-based FPGAs by propagation of broadening effect C De Sio, S Azimi, L Sterpone, B Du IEEE Access 7, 140182-140189, 2019 | 22 | 2019 |
| On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ... 2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013 | 22 | 2013 |
| An extended model to support detailed GPGPU reliability analysis B Du, JER Condia, MS Reorda 2019 14th International Conference on Design & Technology of Integrated …, 2019 | 21 | 2019 |
| A new hybrid nonintrusive error-detection technique using dual control-flow monitoring L Parra, A Lindoso, M Portela-Garcia, L Entrena, B Du, MS Reorda, ... IEEE Transactions on Nuclear Science 61 (6), 3236-3243, 2014 | 21 | 2014 |
| A 3-D simulation-based approach to analyze heavy ions-induced SET on digital circuits L Sterpone, F Luoni, S Azimi, B Du IEEE Transactions on Nuclear Science 67 (9), 2034-2041, 2020 | 20 | 2020 |
| A new CAD tool for Single Event Transient Analysis and mitigation on Flash-based FPGAs S Azimi, B Du, L Sterpone, DM Codinachs, R Grimoldi, L Cattaneo Integration 67, 73-81, 2019 | 19 | 2019 |
| Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs C De Sio, S Azimi, L Bozzoli, B Du, L Sterpone Microelectronics Reliability 100, 113342, 2019 | 18 | 2019 |
| On the prediction of radiation-induced SETs in flash-based FPGAs S Azimi, B Du, L Sterpone Microelectronics Reliability 64, 230-234, 2016 | 18 | 2016 |
| On the evaluation of SEU effects in GPGPUs B Du, JER Condia, MS Reorda, L Sterpone 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 17 | 2019 |
| A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs L Sterpone, S Azimi, L Bozzoli, B Du, T Lange, M Glorieux, ... 2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 120-126, 2018 | 17 | 2018 |
| On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs S Azimi, L Sterpone, B Du, L Boragno Microelectronics Reliability 88, 936-940, 2018 | 16 | 2018 |
| Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment S Azimi, B Du, L Sterpone Journal of Systems Architecture 75, 95-106, 2017 | 16 | 2017 |
| A selective mapper for the mitigation of SETs on rad-hard RTG4 flash-based FPGAs L Sterpone, S Azimi, B Du 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 16 | 2016 |
| Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis W Yang, B Du, C He, L Sterpone Microelectronics Reliability 120, 114122, 2021 | 15 | 2021 |
| Radiation-induced single event transients modeling and testing on nanometric flash-based technologies L Sterpone, B Du, S Azimi Microelectronics Reliability 55 (9-10), 2087-2091, 2015 | 15 | 2015 |
Luca SterponePolitecnico di TorinoEmail verificata su polito.it
