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Coautori
- Thomas M. MooreWaviks, Inc.Email verificata su waviks.com
- Tz-Cheng ChiuNational Cheng Kung UniversityEmail verificata su mail.ncku.edu.tw
- Marcus KaestnerTechnische Universität IlmenauEmail verificata su tu-ilmenau.de
- Stephen T KellyCarl Zeiss Research Microscopy SolutionsEmail verificata su zeiss.com
- Jason FowlkesCenter for Nanophase Materials SciencesEmail verificata su ornl.gov
- Nick RobertsAssociate Professor, Utah State UniversityEmail verificata su usu.edu
- Christopher ParmenterSenior Research Fellow in Cryo-Electron Microscopy, University of NottinghamEmail verificata su nottingham.ac.uk
- Michael W FayUniversity of NottinghamEmail verificata su nottingham.ac.uk
- Brian P GormanColorado School of MinesEmail verificata su mines.edu
- David DiercksColorado School of MinesEmail verificata su mines.edu
- Eric StachDepartment of Materials Science and Engineering, University of PennsylvaniaEmail verificata su seas.upenn.edu
- Norman J. SalmonHummingbird ScientificEmail verificata su hummingbirdscientific.com
- Matt HiscockHead of Product Science, Oxford Instruments NanoAnalysisEmail verificata su oxinst.com
- Soma Sekhar KandulaIntel CorpEmail verificata su intel.com
- Nancy SottosUniversity of Illinois Urbana-ChampaignEmail verificata su illinois.edu
- Philippe H. GeubelleAerospace Engineering, University of IllinoisEmail verificata su illinois.edu
- Deepak GoyalIntel CorporationEmail verificata su intel.com
- Paul HoProfessor, University of Texas at AustinEmail verificata su austin.utexas.edu
- Dr. Sebastian BrandFraunhofer IMWSEmail verificata su imws.fraunhofer.de
- Hrishikesh BaleUniversity of California, Berkeley/ Lawrence Berkeley Natl. LabEmail verificata su lbl.gov