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Toyoko Arai
Toyoko Arai
Email verificata su staff.kanazawa-u.ac.jp
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Citata da
Citata da
Anno
Interplay between nonlinearity, scan speed, damping, and electronics in frequency modulation atomic-force microscopy
M Gauthier, R Pérez, T Arai, M Tomitori, M Tsukada
Physical review letters 89 (14), 146104, 2002
822002
Observation of Electronic States on Si(111)- through Short-Range Attractive Force with Noncontact Atomic Force Spectroscopy
T Arai, M Tomitori
Physical review letters 93 (25), 256101, 2004
722004
Analysis of surface forces on oxides in aqueous solutions using AFM
T Arai, D Aoki, Y Okabe, M Fujihira
Thin solid films 273 (1-2), 322-326, 1996
681996
Tip cleaning and sharpening processes for noncontact atomic force microscope in ultrahigh vacuum
M Tomitori, T Arai
Applied surface science 140 (3-4), 432-438, 1999
541999
Bias dependence of Si (111) 7× 7 images observed by noncontact atomic force microscopy
T Arai, M Tomitori
Applied surface science 157 (4), 207-211, 2000
512000
Removal of contamination and oxide layers from UHV-AFM tips
T Arai, M Tomitori
Applied Physics A: Materials Science & Processing 66, S319-S323, 1998
411998
Effects of electric potentials on surface forces in electrolyte solutions
T Arai, M Fujihira
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
401996
Vibrations of a molecule in an external force field
N Okabayashi, A Peronio, M Paulsson, T Arai, FJ Giessibl
Proceedings of the National Academy of Sciences, 201721498, 2018
362018
Effect of tip shape on force-distance curves for AFM in aqueous electrolytes
T Arai, M Fujihira
Journal of Electroanalytical Chemistry 374 (1-2), 269-273, 1994
351994
Quasi-stabilized hydration layers on muscovite mica under a thin water film grown from humid air
T Arai, K Sato, A Iida, M Tomitori
Scientific Reports 7 (1), 4054, 2017
292017
Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density …
N Okabayashi, A Gustafsson, A Peronio, M Paulsson, T Arai, FJ Giessibl
Physical Review B 93 (16), 165415, 2016
292016
An applicability of scanning tunneling microscopy for surface electron spectroscopy
M Tomitori, M Hirade, Y Suganuma, T Arai
Surface science 493 (1-3), 49-55, 2001
292001
Energy spectrum of backscattered electrons excited by a field emission scanning tunneling microscope with a build-up [111]-oriented W tip
M Tomitori, H Terai, T Arai
Applied surface science 144, 123-127, 1999
291999
Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy
H Ooe, D Kirpal, DS Wastl, AJ Weymouth, T Arai, FJ Giessibl
Applied Physics Letters 109 (14), 141603, 2016
262016
Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy
H Ooe, T Sakuishi, M Nogami, M Tomitori, T Arai
Applied Physics Letters 105 (4), 043107, 2014
232014
A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe
T Arai, M Tomitori
Applied Physics Letters 86 (7), 073110, 2005
232005
Hexagonal arrangement of Ge clusters self-organized on a template of half unit cells of Si (1 1 1)-7× 7 observed by scanning tunneling microscopy
ZA Ansari, T Arai, M Tomitori
Surface science 574 (2-3), L17-L22, 2005
222005
Simultaneous Imaging of Tunneling Current Variation by Noncontact Atomic Force Microscopy in Ultrahigh Vacuum
T Arai, M Tomitori
Japanese Journal of Applied Physics 39 (6S), 3753, 2000
192000
Simultaneous Imaging of Tunneling Current Variation by Noncontact Atomic Force Microscopy in Ultrahigh Vacuum
T Arai, M Tomitori
Appl. Phys 66, S245, 1998
191998
Atom-resolved analysis of an ionic KBr (001) crystal surface covered with a thin water layer by frequency modulation atomic force microscopy
T Arai, M Koshioka, K Abe, M Tomitori, R Kokawa, M Ohta, H Yamada, ...
Langmuir 31 (13), 3876-3883, 2015
182015
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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