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Pritam Yogi
Pritam Yogi
Dy. Technical Officer,Dept. of Electrical Engineering, IIT Delhi
Email verificata su ee.iitd.ac.in
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Comparison of LER Induced Mismatch in NWFET and NSFET for 5-nm CMOS
CK Jha, P Yogi, C Gupta, A Gupta, RA Vega, A Dixit
IEEE Journal of the Electron Devices Society 8, 1184-1192, 2020
72020
Effect of Post Radiation Annealing on the TID Response of 0.18 μm bulk NFETs
K Aditya, M Kumar, CK Jha, R Singh, P Yogi, S Basra, HS Jatana, A Dixit
2019 Electron Devices Technology and Manufacturing Conference (EDTM), 336-338, 2019
42019
Impact of Hot Carrier Injection on Total Ionizing Dose Effect of 10-nm N-channel Bulk FinFETs
P Yogi, M Kumar, K Aditya, C Gupta, A Dixit
2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020
12020
Heavy-Ion Induced Single Event Transients in Sub-7nm Bulk and SOI NSFETs
CK Jha, A Rathi, P Yogi, K Aditya, A Dixit
2020 5th IEEE International Conference on Emerging Electronics (ICEE), 2020
12020
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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