Michelangelo Grosso
Michelangelo Grosso
STMicroelectronics s.r.l.
Verified email at
Cited by
Cited by
System-in-package testing: problems and solutions
D Appello, P Bernardi, M Grosso, MS Reorda
IEEE Design & Test of Computers 23 (3), 203-211, 2006
On the use of embedded debug features for permanent and transient fault resilience in microprocessors
M Portela-García, M Grosso, M Gallardo-Campos, MS Reorda, L Entrena, ...
Microprocessors and Microsystems 36 (5), 334-343, 2012
The energy efficiency management at urban scale by means of integrated modelling
A Ronzino, A Osello, E Patti, L Bottaccioli, C Danna, A Lingua, ...
Energy Procedia 83, 258-268, 2015
Fault grading of software-based self-test procedures for dependable automotive applications
P Bernardi, M Grosso, E Sánchez, O Ballan
2011 Design, Automation & Test in Europe, 1-2, 2011
A programmable BIST for DRAM testing and diagnosis
P Bernardi, M Grosso, MS Reorda, Y Zhang
2010 IEEE International Test Conference, 1-10, 2010
An on-line fault detection technique based on embedded debug features
M Grosso, MS Reorda, M Portela-Garcia, M García-Valderas, ...
2010 IEEE 16th International On-Line Testing Symposium, 167-172, 2010
On-line software-based self-test of the address calculation unit in RISC processors
P Bernardi, L Ciganda, M de Carvalho, M Grosso, J Lagos-Benites, ...
2012 17th IEEE European Test Symposium (ETS), 1-6, 2012
A novel sbst generation technique for path-delay faults in microprocessors exploiting gate-and rt-level descriptions
K Christou, MK Michael, P Bernardi, M Grosso, E Sánchez, MS Reorda
26th IEEE VLSI Test Symposium (vts 2008), 389-394, 2008
A pattern ordering algorithm for reducing the size of fault dictionaries
P Bernardi, M Grosso, M Rebaudengo, MS Reorda
24th IEEE VLSI Test Symposium, 6 pp.-391, 2006
Embedded memory diagnosis: An industrial workflow
D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ...
2006 IEEE International Test Conference, 1-9, 2006
Integrating BIST techniques for on-line SoC testing
A Manzone, P Bernardi, M Grosso, M Rebaudengo, E Sánchez, ...
11th IEEE International On-Line Testing Symposium, 235-240, 2005
A top-down constraint-driven methodology for smart system design
M Crepaldi, M Grosso, A Sassone, S Gallinaro, S Rinaudo, M Poncino, ...
IEEE Circuits and Systems Magazine 14 (1), 37-57, 2014
On the automation of the test flow of complex SoCs
D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ...
24th IEEE VLSI Test Symposium, 6 pp.-171, 2006
Energy-efficient battery charging in electric vehicles with solar panels
M Grosso, D Lena, A Bocca, A Macii, S Rinaudo
2016 IEEE 2nd International Forum on Research and Technologies for Society …, 2016
Smart electronic systems: an overview
A Sassone, M Grosso, M Poncino, E Macii
Smart Systems Integration and Simulation, 5-21, 2016
A hybrid approach for detection and correction of transient faults in SoCs
P Bernardi, LB Poehls, M Grosso, MS Reorda
IEEE Transactions on Dependable and Secure Computing 7 (4), 439-445, 2010
On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors
P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ...
2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013
On the automatic generation of test programs for path-delay faults in microprocessor cores
P Bernardi, M Grosso, E Sánchez, MS Reorda
12th IEEE European Test Symposium (ETS'07), 179-184, 2007
Exploiting fault model correlations to accelerate SEU sensitivity assessment
M Grosso, H Guzman-Miranda, MA Aguirre
IEEE transactions on industrial informatics 9 (1), 142-148, 2012
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core
P Rech, A Paccagnella, M Grosso, MS Reorda, F Melchiori, D Loparco, ...
IEEE Transactions on Nuclear Science 57 (4), 2098-2105, 2010
The system can't perform the operation now. Try again later.
Articles 1–20