Michelangelo Grosso
Michelangelo Grosso
STMicroelectronics s.r.l.
Email verificata su st.com
TitoloCitata daAnno
System-in-package testing: problems and solutions
D Appello, P Bernardi, M Grosso, MS Reorda
IEEE Design & Test of Computers 23 (3), 203-211, 2006
On the use of embedded debug features for permanent and transient fault resilience in microprocessors
M Portela-García, M Grosso, M Gallardo-Campos, MS Reorda, L Entrena, ...
Microprocessors and Microsystems 36 (5), 334-343, 2012
On-line software-based self-test of the address calculation unit in RISC processors
P Bernardi, L Ciganda, M de Carvalho, M Grosso, J Lagos-Benites, ...
2012 17th IEEE European Test Symposium (ETS), 1-6, 2012
Embedded memory diagnosis: An industrial workflow
D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ...
2006 IEEE International Test Conference, 1-9, 2006
A pattern ordering algorithm for reducing the size of fault dictionaries
P Bernardi, M Grosso, M Rebaudengo, MS Reorda
24th IEEE VLSI Test Symposium, 6 pp.-391, 2006
A programmable BIST for DRAM testing and diagnosis
P Bernardi, M Grosso, MS Reorda, Y Zhang
2010 IEEE International Test Conference, 1-10, 2010
An on-line fault detection technique based on embedded debug features
M Grosso, MS Reorda, M Portela-García, M García-Valderas, ...
2010 IEEE 16th International On-Line Testing Symposium, 167-172, 2010
On the automation of the test flow of complex SoCs
D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ...
24th IEEE VLSI Test Symposium, 6 pp.-171, 2006
Fault grading of software-based self-test procedures for dependable automotive applications
P Bernardi, M Grosso, E Sánchez, O Ballan
2011 Design, Automation & Test in Europe, 1-2, 2011
The energy efficiency management at urban scale by means of integrated modelling
A Ronzino, A Osello, E Patti, L Bottaccioli, C Danna, A Lingua, ...
Energy Procedia 83, 258-268, 2015
Integrating BIST techniques for on-line SoC testing
A Manzone, P Bernardi, M Grosso, M Rebaudengo, E Sánchez, ...
11th IEEE International On-Line Testing Symposium, 235-240, 2005
A top-down constraint-driven methodology for smart system design
M Crepaldi, M Grosso, A Sassone, S Gallinaro, S Rinaudo, M Poncino, ...
IEEE Circuits and Systems Magazine 14 (1), 37-57, 2014
Evaluating alpha-induced soft errors in embedded microprocessors
P Rech, S Gerardin, A Paccagnella, P Bernardi, M Grosso, MS Reorda, ...
2009 15th IEEE International On-Line Testing Symposium, 69-74, 2009
Exploiting fault model correlations to accelerate SEU sensitivity assessment
M Grosso, H Guzman-Miranda, MA Aguirre
IEEE Transactions on Industrial Informatics 9 (1), 142-148, 2013
A hybrid approach for detection and correction of transient faults in SoCs
P Bernardi, LB Poehls, M Grosso, MS Reorda
IEEE Transactions on Dependable and Secure Computing 7 (4), 439-445, 2010
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core
P Rech, A Paccagnella, M Grosso, MS Reorda, F Melchiori, D Loparco, ...
IEEE Transactions on Nuclear Science 57 (4), 2098-2105, 2010
A novel SBST generation technique for path-delay faults in microprocessors exploiting gate-and RT-level descriptions
K Christou, MK Michael, P Bernardi, M Grosso, E Sánchez, MS Reorda
26th IEEE VLSI Test Symposium (vts 2008), 389-394, 2008
Control flow checking through embedded debug interface
L Parra, A Lindoso, M Portela, L Entrena, M Grosso, MS Reorda
Proc. 26th Conference on Design of Circuits and Integrated Systems (DCIS …, 2011
On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors
P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ...
2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013
On the automatic generation of test programs for path-delay faults in microprocessor cores
P Bernardi, M Grosso, E Sánchez, MS Reorda
12th IEEE European Test Symposium (ETS'07), 179-184, 2007
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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