| Defect-based delay testing of resistive vias-contacts a critical evaluation K Baker, G Gronthoud, M Lousberg, I Schanstra, C Hawkins International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 | 160 | 1999 |
| Method and terminal for detecting fake and/or modified smart card K Baker US Patent 7,454,318, 2008 | 159 | 2008 |
| Shmoo plotting: The black art of IC testing K Baker, J Van Beers IEEE Design & Test of Computers 14 (3), 90-97, 1997 | 140 | 1997 |
| Multi-lingual closed-captioning K Baker US Patent App. 10/507,995, 2005 | 80 | 2005 |
| Analogue fault simulation based on layout dependent fault models RJA Harvey, AMD Richardson, E Bruls, K Baker Proceedings., International Test Conference, 641-649, 1995 | 80 | 1995 |
| Apparatus for measuring the quiescent current of an integrated monolithic digital circuit SC Verhelst, E Seevinck, K Baker US Patent 5,057,774, 1991 | 77 | 1991 |
| I/sub DDQ/testing because'zero defects isn't enough': a Philips perspective K Baker, B Verhelst Proceedings. International Test Conference 1990, 253-254, 1990 | 71 | 1990 |
| Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? W Moore, G Gronthoud, K Baker, M Lousberg Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159), 95-104, 2000 | 68 | 2000 |
| An analysis of the economics of self-test P Varma, AP Ambler, K Baker Proceedings of the 1984 international test conference on The three faces of …, 1984 | 49 | 1984 |
| QTAG: a standard for test fixture based I/sub DDQ//I/sub SSQ/monitors K Baker Proceedings., International Test Conference, 194-202, 1995 | 44 | 1995 |
| Mixed signal test—techniques, applications and demands K Baker, AM Richardson, AP Dorey IEE Proceedings-Circuits, Devices and Systems 143 (6), 358-365, 1996 | 36 | 1996 |
| A programmable 1400 MOPS video signal processor CM Huizer, K Baker, K Mehtani, J De Block, H Dijkstra, PJ Hynes, ... 1989 Proceedings of the IEEE Custom Integrated Circuits Conference, 24.3/1 …, 1989 | 31 | 1989 |
| Development of a CLASS 1 QTAG monitor K Baker, A Bratt, A Richardson, A Welbers Proceedings., International Test Conference, 213-222, 1995 | 30 | 1995 |
| An Intelligent Knowledge-Based System Tool for High-Level BIST Design. NA Jones, K Baker ITC, 743-749, 1986 | 18 | 1986 |
| Detection of tampering of a smart card interface K Baker, JM Pleunis US Patent 7,293,709, 2007 | 17 | 2007 |
| SIA Roadmaps: Sunset Boulevard for l_DDQ. K Baker ITC, 1121, 1999 | 17 | 1999 |
| Using an electronic paper-based screen to improve contrast K Baker US Patent App. 10/551,015, 2006 | 15 | 2006 |
| Intrusive interactivity is not an ambient experience K Baker IEEE MultiMedia 13 (2), 4-7, 2006 | 14 | 2006 |
| Second coordinate readout in resistive straw drift tubes S Majewski, J Gerbi, B Kross, A Weisenberger, K Baker Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1994 | 14 | 1994 |
| Application of joint time-frequency analysis in mixed signal testing F Bouwman, T Zwemstra, S Hartanato, K Baker, J Koopmans Proceedings., International Test Conference, 747-756, 1995 | 13 | 1995 |
Cornelis (Koen) M. HuizerRetired from Philips ResearchVerified email at huizermail.nl
