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- Andreas F. MolischProfessor of Electrical Engineering, University of Southern CaliforniaEmail verificata su usc.edu
- Shengqian HanBeihang University (BUAA)Email verificata su buaa.edu.cn
- Vishnu V RatnamStaff Research Engineer 2, Samsung Research AmericaEmail verificata su samsung.com
- Linsheng LiHuawei FinlandEmail verificata su huawei.com
- Katsuyuki HanedaAssociate Professor, Department of Electronics and Nanoengineering, Aalto UniversityEmail verificata su aalto.fi
- Seun SangodoyinAssistant Professor, ECE, Georgia Institute of TechnologyEmail verificata su gatech.edu
- Chenwei WangPrincipal Research Engineer, DOCOMO Innovations Inc., Palo Alto, CaliforniaEmail verificata su uci.edu
- Ozgun Y. BursaliogluDocomo InnovationsEmail verificata su docomoinnovations.com
- Giuseppe CaireProfessor, Technical University of Berlin, Germany, and Professor of Electrical Engineering (onEmail verificata su tu-berlin.de
- Nadisanka RupasingheSamsung Research AmericaEmail verificata su samsung.com
- Hao FengIntel LabsEmail verificata su intel.com
- Pan TangBeijing University of Posts and TelecommunicationsEmail verificata su bupt.edu.cn
- Bas, Umit CelalettinAppleEmail verificata su usc.edu