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Ness ShroffDepartment of ECE and CSE, The Ohio State UniversityEmail verificata su osu.edu
Saewoong Bahk (박세웅)Seoul National University, Electrical and Computer EngineeringEmail verificata su snu.ac.kr
Xiaojun LinProfessor of Electrical and Computer Engineering, Purdue UniversityEmail verificata su ecn.purdue.edu
Jihwan ChoiKAIST, KoreaEmail verificata su alum.mit.edu
Bo JiAssociate Professor, Dept. of Computer Science, Virginia TechEmail verificata su vt.edu
Ravi R MazumdarProfessor of ECE, University of WaterlooEmail verificata su uwaterloo.ca
Gaurav SharmaSenior Vice President, D. E. Shaw & Co., L.P.Email verificata su deshaw.com
Changwon NamSamsung electronicsEmail verificata su samsung.com
Atilla EryilmazOhio State UniversityEmail verificata su osu.edu
Jiho Ryu-Email verificata su snu.ac.kr
Daeho KangSeoul National UniversityEmail verificata su netlab.snu.ac.kr
Long Bao LeINRS, University of QuebecEmail verificata su emt.inrs.ca
Eytan ModianoMITEmail verificata su mit.edu
Dong ZhengFacebookEmail verificata su asu.edu
Taekyoung (Ted) KwonSeoul National UniversityEmail verificata su mmlab.snu.ac.kr
YANGHEE CHOISeoul National University/Hallym UniversityEmail verificata su snu.ac.kr
Hyung-Sin KimSeoul National University, Data ScienceEmail verificata su snu.ac.kr
Jonghun HanKorea Railroad Research Institute (한국철도기술연구원)Email verificata su krri.re.kr
Hyoil KimProfessor, Dept. of EE, UNIST (Ulsan National Institute of Science and Technology)Email verificata su unist.ac.kr
Joohyun LeeSchool of Electrical Engineering, Hanyang UniversityEmail verificata su hanyang.ac.kr